Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
About the Editor: Peter W. Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France.
Impact Factor 2014: 0.338 (Copyright ISI Journal Citation Report)
To view individual chapters for Advances in Imaging and Electron Physics, please visit Science Direct.
Praise for the Series: "With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. The Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." - LABORATORY PRACTICE