Seventh International Conference on Engineering Failure Analysis

Workshops

Author Workshop, Tuesday 5th July, 10:35am

PresenterRichard Clegg, Editor-in-Chief of Engineering Failure Analysis

Description:
Richard will give an author workshop on how to write a good research paper. He will be sharing his viewpoints as Editor on the most important elements of a good paper and how to put them together, as well as the ongoing battle he has as an editor to fight against publishing ethics and his suggestion on how to avoid making such mistakes.

Workshop: Field Metallography

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Presenter: Prof A. Neidel, Siemens, Germany

Description:
In an introductory part, the presenter will acquaint attendees with the subject of field metallography. Case studies are presented that show how field metallography or portable metallography can play a role in non-destructively examining evidence in failure analysis. Special emphasis is placed on the danger of misinterpreting microstructures obtained by field metallographic techniques. That first part of the workshop will also stress what the main application of field metallography is, namely condition monitoring and remaining life time estimation of power plant components.

In the second and main part of the workshop, the presenter’s assistants will demonstrate how the most important field metallographic techniques are applied in different industries. First, Patrick Sch├╝le with Block Materialpr├╝fungsgesellschaft mbH out of Berlin, Germany, will show how the replica technique using thin acetate foil is put to use in his service firm. Patrick is going to let the audience get a glimpse of a specialty of application used only by Block.

Second, Heinz-Hubert Cloeren from Cloeren Technology, based in Wegberg, Germany will let attendees participate in his demonstration of another specialty of application of thin acetate foils, when no sputtering equipment is available but contrast should be enhanced nonetheless. Also, Heinz-Hubert will apply a number of different putties that can also be used for replicating geometric features as well as microstructures.

Third and finally, Madeleine Giller from Siemens Berlin is going to demonstrate the latest in high-resolution putties. Madeleine is laboratory manager in the gas turbine manufacturing plant of Siemens Power and Gas and uses state of the art putties in her day to day business. She will show what lateral resolution can be expected of the replica technique, compared with metallographic sections.

In order to let attendees get hands on impressions of the applied techniques, a video link up will provide live images of the assistants’ demonstrations.

Workshop: Fracture Mechanics

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PresenterProfessor. Dr. U. Zerbst, Federal Institute for Materials Research and Testing (BAM), Germany

Description:
Although fatigue crack propagation and fracture cause a large part of failure events in industrial practice, fracture mechanics in failure analysis seems to be still a side issue.

Starting from an introduction into important basic questions of failure analysis and fracture mechanics, the workshop provides a discussion about what kind of questions in failure analysis can be effectively solved by fracture mechanics and which can’t.

Basics of fracture mechanics methodology will be discussed as far as necessary for the purpose of failure analysis. These include the assessment against brittle and ductile fracture as well as fatigue crack propagation and lifetime analysis.

An important requirement to fracture mechanics in failure analysis is a high accuracy of the results particularly with respect to the critical crack size which is much more essential as, e.g. for the design stage. The accuracy is limited by both, intrinsic factors of the method and the availability and quality of the input information. Special attention will be devoted to this aspect.

The discussion is illustrated with a number of case studies. These are aimed to provide a deeper understanding of the prospects of fracture mechanics in failure analysis, its correct application, its limitations but also the pitfalls to be avoided.