VLSI Electronics

VLSI Electronics

Microstructure Science

1st Edition - April 28, 1982

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  • Editor: Norman G. Einspruch
  • eBook ISBN: 9781483217703

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VLSI Electronics: Microstructure Science, Volume 3 evaluates trends for the future of very large scale integration (VLSI) electronics and the scientific base that supports its development. This book discusses the impact of VLSI on computer architectures; VLSI design and design aid requirements; and design, fabrication, and performance of CCD imagers. The approaches, potential, and progress of ultra-high-speed GaAs VLSI; computer modeling of MOSFETs; and numerical physics of micron-length and submicron-length semiconductor devices are also elaborated. This text likewise covers the optical linewidth measurements on photomasks and wafers and effects of materials technology and fabrication tolerances on guided-wave optical communication and signal processing. This volume is recommended for scientists and engineers who wish to become familiar with VLSI electronics, device designers concerned with the fundamental character of and limitations to device performance, systems architects who will be charged with tying VLSI circuits together, and engineers conducting work on the utilization of VLSI circuits in specific areas of application.

Table of Contents

  • List of Contributors


    Chapter 1 Impact of VLSI on Computer Architectures

    I. Introduction

    II. Single-Chip Computers

    III. Special-Purpose VLSI Chips

    IV. Conclusion


    Chapter 2 VLSI Design and Design Aid Requirements

    I. Introduction

    II. State-of-the-Art versus Workhorse Technologies

    III. Designer Goals in Workhorse Technologies

    IV. Next-Generation Requirements

    V. The Problem and the Approach

    VI. The Future


    Additional References

    Chapter 3 Design, Fabrication, and Performance of CCD Imagers

    I. Introduction

    II. Silicon CCD Imagers with Intrinsic Photoresponse

    III. PtSi-Silicon Schottky-Barrier Infrared Image Sensors

    IV. Other Infrared Imagers

    V. Prospects for the Future


    Chapter 4 Ultra-High-Speed GaAs VLSI: Approaches, Potential, and Progress

    I. Introduction

    II. GaAs Device Approaches for Ultra-High-Speed VLSI

    III. Yield Analysis and Implications for VLSI Design

    IV. The Schottky Diode-FET Logic Circuit Approach for Ultra-High-Speed GaAs VLSI

    V. Planar GaAs LSI/VLSI Fabrication Technology

    VI. Experimental Performance Results for Planar SDFL LSI GaAs ICs

    VII. Summary


    Chapter 5 Computer Modeling of MOSFETs

    I. Introduction

    II. MOSFET Device Modeling

    III. Results and Discussion

    IV. Conclusions


    Chapter 6 The Numerical Physics of Micron-Length and Submicron-Length Semiconductor Devices

    I. Introduction

    II. The Semiconductor Equations

    III. The Boltzmann Transport Equation

    IV. Quantum Transport Theory

    V. Diffusion

    Appendix A. Derivation of the Balance Equations

    Appendix B. The Wigner Distribution Function


    Chapter 7 Optical Linewidth Measurements on Photomasks and Wafers

    I. Introduction

    II. Limitations of Traditional Methods

    III. Modeling of the Optical Image

    IV. Primary Linewidth-Measurement System

    V. Primary Linewidth Measurements on Photomasks

    VI. Linewidth Measurements with Conventional Optical Systems on Photomasks

    VII. Linewidth Measurements on Other Materials


    Chapter 8 The Effects of Materials Technology and Fabrication Tolerances on Guided-Wave Optical Communication and Signal Processing

    I. Introduction

    II. Optical Guided-Wave Components in Communications and Signal-Processing Systems

    III. The Effect of Fabrication Techniques on the Performance of Optical Guided-Wave Components

    IV. Conclusion


    Chapter 9 The Impact of VLSI on CAM

    I. Introduction

    II. CAM's Structure

    III. VLSIs Impact on CAM

    IV. Education and Training



    Contents of Other Volumes

Product details

  • No. of pages: 468
  • Language: English
  • Copyright: © Academic Press 1982
  • Published: April 28, 1982
  • Imprint: Academic Press
  • eBook ISBN: 9781483217703

About the Editor

Norman G. Einspruch

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