Trace Analysis By Mass Spectrometry

List of Contributors

Preface


1 Introductory Review


1.1 Proem


1.2 Résumé


1.3 Problems and Proposals

References


2 Physics and Techniques of Electrical Discharge Ion Sources


2.1 The Task of the Ion Source: From Solids to Ion Beams


2.2 Physics of Electrical Discharges in Vacuum


2.3 Techniques of Ion Formation Using Electrical Discharges


2.4 Ion Source Configurations

References


3 The Transmission of Ions through Double Focusing Mass Spectrometers


3.1 Focusing and Dispersing Properties of Deflection Fields


3.2 Field Combinations to Achieve Velocity Focusing in Addition to Angular Focusing


3.3 Deviations of the Properties of Real Fields from the Results of the Simplified First-Order Theory


3.4 Focusing in the z-Direction


3.5 Performance Characteristics


3.6 Existing Instruments

References


4 Detection and Measurement of Ions by Ion-Sensitive Plates


4.1 Introduction


4.2 General Considerations


4.3 Physical Characteristics


4.4 The Blackening Process


4.5 Plate Response and Evaluation


4.6 Plate Replacement Schemes and Special Methods


4.7 Plate Processing


4.8 Conclusions

References


5 Electrical Measurements of Mass Resolved Ion Beams


5.1 Introduction


5.2 Historical Development


5.3 Signal Characteristics


5.4 Signal Referencing


5.5 Scanning


5.6 Peak Switching


5.7 Errors


5.8 Detection Limits


5.9 Analysis Time


5.10 Other Applications and Techniques


5.11 Summary

References


6 Interpretation of Mass Spectrograph Plates


6.1 Introduction


6.2 The Spark-Source Mass Spectrograph Plate


6.3 Qualitative Analysis


6.4 Quantitative Analysis—Theoretical Considerations


6.5 Quantitative Analysis—Practical Considerations


6.6 Treatment of Results


6.7 Summary

References


7 Computer Techniques for Solids Analysis


7.1 Introduction


7.2 What Can/Should Computers Do for the Mass Spectrometrist?


7.3 Batch Systems


7.4 Using Time-Sharing


7.5 Dedicated or "Stand Alone" Systems—Minicomputers


7.6 Languages

References


8 Relating the Mass Spectrum to the Solid Sample Composition


8.1 Introduction


8.2 Elemental Discrimination and Its Control


8.3 Relative Sensitivity Factors


8.4 Standard Samples


8.5 Isotope Dilution

References


9 Insulators, Powders, and Microsamples


9.1 Introduction


9.2 Experimental Techniques


9.3 Analysis of Microsamples

References


10 The Analysis of Low-Melting and Reactive Samples


10.1 Introduction


10.2 Sodium Sampling and Handling Techniques


10.3 Analysis of Sample


10.4 Results and Discussion


10.5 On-Stream Analysis by SSMS

References


11 The Analysis of Radioactive Samples by Spark-Source Mass Spectrometry


11.1 Introduction


11.2 Protection


11.3 Uranium and Transuranium Samples


11.4 Other Radioactive Samples

References


12 The Analysis of Gases in Solids


12.1 Introduction


12.2 Standards


12.3 Vacuum Extraction and Fusion Techniques


12.4 Spark Source Technique


12.5 Ion Microprobe Mass Spectrometry


12.6 Analysis of Lunar Samples


12.7 Conclusions and Prognoses

References


13 Surface and Thin Films Analysis


13.1 Introduction


13.2 General Statement of the Analysis Problem


13.3 Instrumentation and Applications

References


14 Laser Ion Source Analysis of Solids


14.1 Introduction


14.2 Laser Source


14.3 Data Collection


14.4 Applications of Laser Source Mass Spectrometry


14.5 Sensitivity, Selectivity, Precision, and Accuracy


14.6 Uniqueness of the Laser Source

References

Author Index

Subject Index