Theory of Semiconductor Junction Devices - 1st Edition - ISBN: 9780080121734, 9781483156903

Theory of Semiconductor Junction Devices

1st Edition

A Textbook for Electrical and Electronic Engineers

Authors: J. H. Leck
eBook ISBN: 9781483156903
Imprint: Pergamon
Published Date: 1st January 1967
Page Count: 178
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Theory of Semiconductor Junction Devices: A Textbook for Electrical and Electronic Engineers presents the simplified numerical computation of the fundamental electrical equations, specifically Poisson's and the Hall effect equations. This book provides the fundamental theory relevant for the understanding of semiconductor device theory.
Comprised of 10 chapters, this book starts with an overview of the application of band theory to the special case of semiconductors, both intrinsic and extrinsic. This text then describes the electrical properties of conductivity, semiconductors, and Hall effect leading to the main topic of p–n junction theory. Other chapters examine the characteristics of the p–n junction in detail as this forms the fundamental element in the majority of semiconductor devices. The final chapter deals with the field effect transistor, which is known as the unipolar transistor. This book is a valuable resource for students of solid state electronics. Electrical and electronic engineers will also find this book useful.

Table of Contents

Preface Acknowledgments Fundamental Constants, Units and Symbols References Chapter 1. General Introduction 1.1. Introductory Survey 1.2. Electrical Conductivity 1.3. The Hall Effect 1.4. Compound Semiconductors Chapter 2. Basic Theory I. The Homogeneous Semiconductor 2.1. Insulators, Semiconductors and Metals 2.2. The Fermi-Dirac Distribution Law 2.3. The Extrinsic Semiconductor 2.3.1. Addition of Group V Impurities 2.3.2. Addition of Group III Impurities 2.3.3. Electron and Hole Densities in the Extrinsic Semiconductor 2.3.4. Addition of Both Donor and Acceptor Impurities 2.3.5. The Extrinsic Semiconductor at Very High and Very Low Temperatures 2.4. General Observations 2.4.1. Degeneracy 2.4.2. Other Impurities in Silicon and Germanium 2.4.3. Doping of Compound Semiconductors 2.4.4. Comparison of Models of Chapters 1 and 2 Chapter 3. Basic Theory II. The Effect of Inhomogeneities and External Forces 3.1. The Electric Field 3.2. Charge Disturbance in the Semiconductor 3.2.1. The Majority Carriers 3.2.2. The Minority Carriers 3.3. Diffusion and Recombination Processes 3.3.1. Carrier Diffusion 3.3.2. Recombination of Excess Carriers 3.3.3. Diffusion and Recombination 3.4. Injection of Carriers into a Semiconductor Chapter 4. Basic Theory III. Dynamical Considerations 4.1. Recombination, Generation and Trapping Processes 4.2. Photo-excitation 4.3. The Cadmium Sulphide Radiation Detector Chapter 5. The p-n Junction I. Theory 5.1. Potential Difference Across the p-n Junction 5.2. Current Flow in the Junction Region 5.3. Junction with an Applied Voltage 5.4. Diffusion of Minority Carriers Outwards from the Junction 5.5. Current Flow due to Minority Carrier Diffusion Chapter 6. The p-n Junctio


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J. H. Leck

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