Reliability, Robustness and Failure Mechanisms of LED Devices - 1st Edition - ISBN: 9781785481529, 9780081010884

Reliability, Robustness and Failure Mechanisms of LED Devices

1st Edition

Methodology and Evaluation

Authors: Yannick Deshayes Laurent Bechou
eBook ISBN: 9780081010884
Hardcover ISBN: 9781785481529
Imprint: ISTE Press - Elsevier
Published Date: 23rd September 2016
Page Count: 172
Tax/VAT will be calculated at check-out Price includes VAT (GST)
30% off
30% off
30% off
30% off
30% off
20% off
20% off
30% off
30% off
30% off
30% off
30% off
20% off
20% off
30% off
30% off
30% off
30% off
30% off
20% off
20% off
78.95
55.27
55.27
55.27
55.27
55.27
63.16
63.16
66.99
46.89
46.89
46.89
46.89
46.89
53.59
53.59
110.00
77.00
77.00
77.00
77.00
77.00
88.00
88.00
Unavailable
Price includes VAT (GST)
× DRM-Free

Easy - Download and start reading immediately. There’s no activation process to access eBooks; all eBooks are fully searchable, and enabled for copying, pasting, and printing.

Flexible - Read on multiple operating systems and devices. Easily read eBooks on smart phones, computers, or any eBook readers, including Kindle.

Open - Buy once, receive and download all available eBook formats, including PDF, EPUB, and Mobi (for Kindle).

Institutional Access

Secure Checkout

Personal information is secured with SSL technology.

Free Shipping

Free global shipping
No minimum order.

Description

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.
This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

 

Key Features

  • Deals exclusively with reliability, based on the physics of failure for infrared LEDs
  • Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications
  • Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution
  • Focuses on the method to extract fundamental parameters from electrical and optical characterizations

Readership

Practitioners and engineers, small and mid-sized enterprises; postgraduate students, academics, and researchers

Table of Contents

  • Preface
  • 1: State-of-the-Art of Infrared Technology
    • Abstract
    • 1.1 Introduction
    • 1.2 Compound materials III-V
    • 1.3 Light-emitting diodes
    • 1.4 Applications
    • 1.5 Conclusion
  • 2: Analysis and Models of an LED
    • Abstract
    • 2.1 Introduction
    • 2.2 Physicochemical analysis
    • 2.3 Electro-optical analysis
    • 2.4 Initial characterizations of 935 nm LEDs
    • 2.5 Conclusion
  • 3: Physics of Failure Principles
    • Abstract
    • 3.1 Introduction
    • 3.2 Aging tests
    • 3.3 Failure signatures
    • 3.4 Physics of failures
    • 3.5 Conclusion
  • 4: Methodologies of Reliability Analysis
    • Abstract
    • 4.1 Introduction
    • 4.2 Method based on the physics of failures
    • 4.3 Digital methods
    • 4.4 A new approach
    • 4.5 Conclusion
  • Bibliography
  • Index

Details

No. of pages:
172
Language:
English
Copyright:
© ISTE Press - Elsevier 2016
Published:
Imprint:
ISTE Press - Elsevier
eBook ISBN:
9780081010884
Hardcover ISBN:
9781785481529

About the Author

Yannick Deshayes

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices.

Affiliations and Expertise

IMS Laboratory, University of Bordeaux, Bordeaux, France

Laurent Bechou

Laurent Bechou is full Professor at the University of Bordeaux, France, and has worked for the last 5 years in IMS laboratory. He is responsible for the “Assessment of Micro-Nano Devices and Assemblies” (EDMiNA in French) team. He is also the Head of "Evaluation of Micro and Nano-Assemblied Devices" Research Group.

Affiliations and Expertise

IMS Laboratory, University of Bordeaux, Bordeaux, France