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Reliability, Robustness and Failure Mechanisms of LED Devices
Methodology and Evaluation
1st Edition - September 23, 2016
Authors: Yannick Deshayes, Laurent Bechou
Language: English
Hardback ISBN:9781785481529
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eBook ISBN:9780081010884
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The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such te…Read more
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The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.
Deals exclusively with reliability, based on the physics of failure for infrared LEDs
Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications
Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution
Focuses on the method to extract fundamental parameters from electrical and optical characterizations
Practitioners and engineers, small and mid-sized enterprises; postgraduate students, academics, and researchers
Preface
1: State-of-the-Art of Infrared Technology
Abstract
1.1 Introduction
1.2 Compound materials III-V
1.3 Light-emitting diodes
1.4 Applications
1.5 Conclusion
2: Analysis and Models of an LED
Abstract
2.1 Introduction
2.2 Physicochemical analysis
2.3 Electro-optical analysis
2.4 Initial characterizations of 935 nm LEDs
2.5 Conclusion
3: Physics of Failure Principles
Abstract
3.1 Introduction
3.2 Aging tests
3.3 Failure signatures
3.4 Physics of failures
3.5 Conclusion
4: Methodologies of Reliability Analysis
Abstract
4.1 Introduction
4.2 Method based on the physics of failures
4.3 Digital methods
4.4 A new approach
4.5 Conclusion
Bibliography
Index
No. of pages: 172
Language: English
Edition: 1
Published: September 23, 2016
Imprint: ISTE Press - Elsevier
Hardback ISBN: 9781785481529
eBook ISBN: 9780081010884
YD
Yannick Deshayes
Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices. He develops quantum theory to establish degradation laws on photonics devices for LED, laser and photonics applications..
Affiliations and expertise
Associate Professor, University of Bordeaux, France
LB
Laurent Bechou
Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.
Affiliations and expertise
Université de Sherbrooke
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