
Quantitative Atomic-Resolution Electron Microscopy
Description
Key Features
- Contains contributions from leading authorities on the subject matter
- Informs and updates on the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Readership
Undergraduates, graduates, academics and researchers in the field of Advances in Imaging and Electron Physics
Table of Contents
1. Introduction
Sandra Van Aert
2. Statistical parameter estimation theory
Sandra Van Aert
3. Efficient fitting algorithm
Sandra Van Aert
4. Statistics-based atom counting
Sandra Van Aert
5. Atom column detection
Sandra Van Aert
6. Optimal experiment design for nanoparticle atom-counting from ADF STEM images
Sandra Van Aert
7. Maximum a posteriori probability
Sandra Van Aert
8. Discussion and conclusions
Sandra Van Aert
9. Phase retrieval methods applied to coherent imaging
Tatiana Latychevskaia
Product details
- No. of pages: 294
- Language: English
- Copyright: © Academic Press 2021
- Published: March 31, 2021
- Imprint: Academic Press
- Hardcover ISBN: 9780128246078
- eBook ISBN: 9780323850933
About the Serial Editors
Martin Hÿtch
Affiliations and Expertise
Peter W. Hawkes

Affiliations and Expertise
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