Principles of Semiconductor Network Testing - 1st Edition - ISBN: 9780750694728, 9780080539560

Principles of Semiconductor Network Testing

1st Edition

Authors: Amir Afshar
Hardcover ISBN: 9780750694728
eBook ISBN: 9780080539560
Imprint: Newnes
Published Date: 5th June 1995
Page Count: 350
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Description

Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References

Key Features

Introduces a novel component-testing philosophy for semiconductor test, product and design engineers. Best new source of information for experienced semiconductor engineers as well as entry-level personnel. Eight chapters about semiconductor testing.

Readership

Semiconductor design & test engineers

Table of Contents

Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References

Details

No. of pages:
350
Language:
English
Copyright:
© Newnes 1995
Published:
Imprint:
Newnes
eBook ISBN:
9780080539560
Hardcover ISBN:
9780750694728

About the Author

Amir Afshar

Affiliations and Expertise

National Semiconductor