Principles of Semiconductor Network Testing - 1st Edition - ISBN: 9780750694728, 9780080539560

Principles of Semiconductor Network Testing

1st Edition

Authors: Amir Afshar
eBook ISBN: 9780080539560
Hardcover ISBN: 9780750694728
Imprint: Newnes
Published Date: 5th June 1995
Page Count: 350
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Description

Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Key Features

  • Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
  • Best new source of information for experienced semiconductor engineers as well as entry-level personnel
  • Eight chapters about semiconductor testing

Readership

Semiconductor design and test engineers

Table of Contents

Diode and transistor operation
Integrated circuit test basics
Digital logic test
Noise identification
Operational amplifier general information
Data acquisition devices
Digital signal processing
CODEC (Coder/Decoder)

Details

No. of pages:
350
Language:
English
Copyright:
© Newnes 1995
Published:
Imprint:
Newnes
eBook ISBN:
9780080539560
Hardcover ISBN:
9780750694728

About the Author

Amir Afshar

Affiliations and Expertise

National Semiconductor