Principles of Semiconductor Network Testing

1st Edition

Authors: Amir Afshar
Hardcover ISBN: 9780750694728
eBook ISBN: 9780080539560
Imprint: Newnes
Published Date: 5th June 1995
Page Count: 350
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Description

This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.

This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.

Key Features

Introduces a novel component-testing philosophy for semiconductor test, product and design engineers. Best new source of information for experienced semiconductor engineers as well as entry-level personnel. Eight chapters about semiconductor testing.

Readership

Semiconductor design & test engineers

Table of Contents

Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References

Details

No. of pages:
350
Language:
English
Copyright:
© Newnes 1995
Published:
Imprint:
Newnes
eBook ISBN:
9780080539560
Hardcover ISBN:
9780750694728

About the Author

Amir Afshar

Affiliations and Expertise

National Semiconductor