
Principles of Electron Optics, Volume 1
Basic Geometrical Optics
Description
Key Features
- Offers a fully revised and expanded new edition based on the latest research developments in electron optics
- Written by the top experts in the field
- Covers every significant advance in electron optics since the subject originated
- Contains exceptionally complete and carefully selected references and notes
- Serves both as a reference and text
Readership
Postgraduate students and teachers in physics and electron optics; researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy, and nanolithography
Table of Contents
Preface
1. Introduction
PART I – CLASSICAL MECHANICS
2. Relativistic Kinematics
3. Different Forms of Trajectory Equations
4. Variational Principles
5. Hamiltonian Optics
PART II – CALCULATION OF STATIC FIELDS
6. Basic Concepts and Equations
7. Series Expansions
8. Boundary-Value Problems
9. Integral Equations
10. The Boundary-Element Method
11. The Finite-Difference Method (FDM)
12. The Finite-Element Method (FEM)
13. Field-Interpolation Techniques
PART III – THE PARAXIAL APPROXIMATION
14. Introduction
15. Systems with an Axis of Rotational Symmetry
16. Gaussian Optics of Rotationally Symmetric Systems: Asymptotic Image Formation
17. Gaussian Optics of Rotationally Symmetric Systems: Real Cardinal Elements
18. Electron Mirrors
19. Quadrupole Lenses
20. Cylindrical Lenses
PART IV – ABERRATIONS
21. Introduction
22. Perturbation Theory: General Formalism
23. The Relation Between Permitted Types of Aberration and System Symmetry
24. The Geometrical Aberrations of Round Lenses
25. Asymptotic Aberration Coefficients
26. Chromatic Aberrations
27. Aberration Matrices and the Aberrations of Lens Combinations
28. The Aberrations of Mirrors and Cathode Lenses
29. The Aberrations of Quadrupole Lenses and Octopoles
30. The Aberrations of Cylindrical Lenses
31. Parasitic Aberrations
PART V – DEFLECTION SYSTEMS
32. Paraxial Properties of Deflection Systems
33. The Aberrations of Deflection Systems
PART VI – COMPUTER-AIDED ELECTRON OPTICS
34. Numerical Calculation of Trajectories, Paraxial Properties and Aberrations
Notes and References
Index
Product details
- No. of pages: 728
- Language: English
- Copyright: © Academic Press 2017
- Published: October 29, 2017
- Imprint: Academic Press
- eBook ISBN: 9780081022573
- Paperback ISBN: 9780081022566
About the Authors
Peter Hawkes

Affiliations and Expertise
Erwin Kasper
Affiliations and Expertise
Ratings and Reviews
Latest reviews
(Total rating for all reviews)
Gaeun C. Thu Aug 05 2021
Good
great book