Principles of Electron Optics, Volume 1

Principles of Electron Optics, Volume 1

Basic Geometrical Optics

2nd Edition - October 29, 2017

Write a review

  • Authors: Peter Hawkes, Erwin Kasper
  • eBook ISBN: 9780081022573
  • Paperback ISBN: 9780081022566

Purchase options

Purchase options
DRM-free (PDF, Mobi, EPub)
Sales tax will be calculated at check-out

Institutional Subscription

Free Global Shipping
No minimum order


Volume one of Principles of Electron Optics: Basic Geometrical Optics, Second Edition, explores the geometrical optics needed to analyze an extremely wide range of instruments: cathode-ray tubes; the family of electron microscopes, including the fixed-beam and scanning transmission instruments, the scanning electron microscope and the emission microscope; electron spectrometers and mass spectrograph; image converters; electron interferometers and diffraction devices; electron welding machines; and electron-beam lithography devices. The book provides a self-contained, detailed, modern account of electron optics for anyone involved with particle beams of modest current density in the energy range up to a few mega-electronvolts. You will find all the basic equations with their derivations, recent ideas concerning aberration studies, extensive discussion of the numerical methods needed to calculate the properties of specific systems and guidance to the literature of all the topics covered. A continuation of these topics can be found in volume two, Principles of Electron Optics: Applied Geometrical Optics. The book is intended for postgraduate students and teachers in physics and electron optics, as well as researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy and nanolithography.

Key Features

  • Offers a fully revised and expanded new edition based on the latest research developments in electron optics
  • Written by the top experts in the field
  • Covers every significant advance in electron optics since the subject originated
  • Contains exceptionally complete and carefully selected references and notes
  • Serves both as a reference and text


Postgraduate students and teachers in physics and electron optics; researchers and scientists in academia and industry working in the field of electron optics, electron and ion microscopy, and nanolithography

Table of Contents

  • Preface
    1. Introduction

    2. Relativistic Kinematics
    3. Different Forms of Trajectory Equations
    4. Variational Principles
    5. Hamiltonian Optics

    6. Basic Concepts and Equations
    7. Series Expansions
    8. Boundary-Value Problems
    9. Integral Equations
    10. The Boundary-Element Method
    11. The Finite-Difference Method (FDM)
    12. The Finite-Element Method (FEM)
    13. Field-Interpolation Techniques

    14. Introduction
    15. Systems with an Axis of Rotational Symmetry
    16. Gaussian Optics of Rotationally Symmetric Systems: Asymptotic Image Formation
    17. Gaussian Optics of Rotationally Symmetric Systems: Real Cardinal Elements
    18. Electron Mirrors
    19. Quadrupole Lenses
    20. Cylindrical Lenses

    21. Introduction
    22. Perturbation Theory: General Formalism
    23. The Relation Between Permitted Types of Aberration and System Symmetry
    24. The Geometrical Aberrations of Round Lenses
    25. Asymptotic Aberration Coefficients
    26. Chromatic Aberrations
    27. Aberration Matrices and the Aberrations of Lens Combinations
    28. The Aberrations of Mirrors and Cathode Lenses
    29. The Aberrations of Quadrupole Lenses and Octopoles
    30. The Aberrations of Cylindrical Lenses
    31. Parasitic Aberrations

    32. Paraxial Properties of Deflection Systems
    33. The Aberrations of Deflection Systems

    34. Numerical Calculation of Trajectories, Paraxial Properties and Aberrations

    Notes and References

Product details

  • No. of pages: 728
  • Language: English
  • Copyright: © Academic Press 2017
  • Published: October 29, 2017
  • Imprint: Academic Press
  • eBook ISBN: 9780081022573
  • Paperback ISBN: 9780081022566

About the Authors

Peter Hawkes

Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

Erwin Kasper

Erwin Kasper studied physics at the Universities of Münster and Tübingen (Germany), where he obtained his PhD in 1965 and the habilitation to teach physics in 1969. After scientific spells in the University of Tucson, Arizona (1966) and in Munich (1970), he resumed his research and teaching in the Institute of Applied Physics, University of Tübingen, where he was later appointed professor. He lectured on general physics and especially on electron optics. The subject of his research was theoretical electron optics and related numerical methods on which he published numerous papers. After his retirement in 1997, he published a book on numerical field calculation (2001).

Affiliations and Expertise

Institute of Applied Physics, University of Tuebingen, Tuebingen, Germany

Ratings and Reviews

Write a review

Latest reviews

(Total rating for all reviews)

  • Gaeun C. Thu Aug 05 2021


    great book