Plasmon Coupling Physics

Plasmon Coupling Physics

1st Edition - June 16, 2022

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  • Editors: Martin Hÿtch, Peter W. Hawkes
  • eBook ISBN: 9780323989084
  • Hardcover ISBN: 9780323989077

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Plasmon Coupling Physics, Wave Effects and their Study by Electron Spectroscopies, Volume 222 in the Advances in Imaging and Electron Physics serial, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains. Specific chapters in this release cover Phase retrieval methods applied to coherent imaging, X-ray phase-contrast imaging: a broad overview of some fundamentals, Graphene and borophene as nanoscopic materials for electronics – with review of the physics, and more.

Key Features

  • Provides the authority and expertise of leading contributors from an international board of authors
  • Presents the latest release in the Advances in Imaging and Electron Physics series
  • Updated release includes the latest information on the Plasmon Coupling Physics, Wave Effects and their Study by Electron Spectroscopies


Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

Table of Contents

  • Cover image
  • Title page
  • Table of Contents
  • Copyright
  • Contributor
  • Preface
  • Chapter One: A brief introduction to nano-optics with fast electrons
  • Abstract
  • 1. Introduction
  • 2. Elements of nano-optics and plasmonics
  • 3. Electron microscopy and spectroscopies
  • 4. Light interferometry in cathodoluminescence
  • 5. The boundary element method and its application in plasmonics
  • 6. Sample preparation: the electron beam lithography
  • References
  • Chapter Two: A unified description of inelastic scattering of relativistic electron beams and its application to holography
  • Abstract
  • 1. Presentation of the problem
  • 2. Preliminary remarks: conventions, Green functions, gauge fixing
  • 3. Propagators for the electromagnetic field in presence of a polarizable medium
  • 4. Kinetic equation for the electron density matrix
  • 5. Single scattering approximation: application to electron energy loss experiments
  • 6. Summary and perspectives
  • 7. Additional derivations
  • References
  • Chapter Three: Development of phase-shaped electron energy-loss spectroscopy for nano-optics
  • Abstract
  • 1. Introduction
  • 2. Hermite-Laguerre-Gaussian electron beams
  • 3. Semi-classical and quasi-static transition probability: analogy with atomic physics
  • 4. Comparison between light and electrons in the broad illumination limit
  • 5. First experimental demonstration
  • 6. Polarized electron nano-spectroscopies: connection to the local density of optical states
  • 7. Application of phase-shaped EELS to actual problems in plasmonics
  • 8. Optical polarization analogue
  • 9. Generalization: optical selection rules in the inelastic scattering of arbitrary Hermite-Laguerre-Gaussian states
  • 10. Classical limit, connection to conventional EELS
  • 11. Measurement of the coherence at the nanometer scale
  • 12. Cathodoluminescence experiments with phase-shaped beams
  • 13. Summary and perspectives
  • 14. Useful relations on Hermite-Gauss functions
  • References
  • Chapter Four: Exploring nano-optical excitations coupling with fast electrons techniques
  • Abstract
  • 1. Introduction
  • 2. Nanocross: a highly tunable plasmonic system
  • 3. Self-hybridization within non-Hermitian localized plasmonic systems
  • 4. Substrate effect on plasmon resonances in nano-cube
  • 5. Probing plasmon-NV0 coupling at the nanometer scale with photons and fast electrons
  • 6. Summary and perspectives
  • 7. Supporting information
  • References
  • Index

Product details

  • No. of pages: 312
  • Language: English
  • Copyright: © Academic Press 2022
  • Published: June 16, 2022
  • Imprint: Academic Press
  • eBook ISBN: 9780323989084
  • Hardcover ISBN: 9780323989077

About the Editors

Martin Hÿtch

Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France

Peter W. Hawkes

Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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