Description

Passivation of Metals and Semiconductors, and Properties of Thin Oxide Layers contains a selection of papers presented at PASSIVITY-9, the 9th International Symposium on the Passivation of Metals and Semiconductors and the Properties of Thin Oxide Layers, which was held in Paris, 27 June - 1 July, 2005. One hundred and twelve peer-reviewed manuscripts have been included.

The book covers all the fundamental and applied aspects of passivity and provides a relevant and updated view of the advances and new trends in the field. It is structured in ten sections:
• Growth, (Nano)structure and Composition of Passive Films
• Passivity of Semiconductors
• Electronic Properties of Passive Films
• Passivity Issues in Biological Systems
• Passivity in High-Temperature Water
• Mechanical Properties of Passive Films, • Passivity Issues in Stress Corrosion Cracking and Tribocorrosion
• Passivity Breakdown and Localized Corrosion
• Modeling and Simulation
• Surface Modifications and Inhibitors (for Improved Corrosion Resistance and/or Adhesion)

Readership

-Chemical Engineers
-Corrosion and Material Scientists
-Metallurgists and Surface Chemists
-Physicists at Graduate and Postgraduate Level

Table of Contents

Section Headings
Growth, (Nano)structure and Composition of Passive Films
Passivity of Semiconductors
Electronic Properties of Passive Films
Passivity Issues in Biological Systems
Passivity in High Temperature Water
Mechanical Properties of Passive films
Passivity Issues in Stress Corrosion Cracking and Tribocorrosion
Passivity Breakdown and Localized Corrosion
Modeling and Simulation
Surface Modifications and Inhibitors (for Improved Corrosion Resistance and/or Adhesion)

Details

No. of pages:
764
Language:
English
Copyright:
© 2006
Published:
Imprint:
Elsevier Science
Electronic ISBN:
9780080461526
Print ISBN:
9780444522245
Print ISBN:
9780444559098

About the editors