
Nanocharacterization Techniques
Description
Key Features
- Includes a detailed analysis of different nanocharacterization techniques, allowing readers to explore which one is best for their particular needs
- Provides examples of how each characterization technique has been used, giving readers a greater understanding of how each technique can be profitably used
- Covers the mathematical background needed to utilize each of these techniques to their best effect, meaning that readers can gain a full understanding of the theoretical principles behind each technique covered
- Serves as an important, go-to reference for materials scientists and engineers
Readership
Materials scientists and engineers, as well as those working in the natural and life sciences seeking a reference work outlining the essential principles of nanostructures and nanomaterials. Scientists working in related disciplines who may be relatively new to nanotechnology, and graduate students
Table of Contents
1: Scanning Electron Microscopy
- Abstract
- 1. Introduction
- 2. Scanning Electron Microscope
- 3. Using the SEM
- 4. Developments in Scanning Electron Microscopy
- 5. Low-Voltage Scanning Electron Microscopy
- 6. Environmental Scanning Electron Microscopy
- 7. Electron Backscatter Diffraction
- 8. Energy-Dispersive X-Ray Spectroscopy in Scanning Electron Microscopy
- 9. Electron Beam Lithography
- 10. Nanomanipulation
- List of Symbols
2: Atomic Force Microscopy: A Powerful Tool for Electrical Characterization
- Abstract
- 1. Introduction
- 2. Operating Principles
- 3. Operating Modes
- 4. Image Processing and Analysis
- 5. Electrical Nanocharacterization
- List of Symbols
3: Spectroscopic Techniques for Characterization of Nanomaterials
- Abstract
- 1. Ultraviolet–Visible Absorption
- 2. Fourier Transform Infrared Spectroscopy
- 3. Raman Scattering
- 4. Surface-Enhanced Raman Scattering
- List of Symbols
4: Dynamic Light Scattering Applied to Nanoparticle Characterization
- Abstract
- 1. Theory
- 2. Applications
- List of Abbreviations and Symbols
5: X-Ray Diffraction and Scattering by Nanomaterials
- Abstract
- 1. X-Ray Diffraction Applied to the Study of Nanocrystalline Powders
- 2. Small-Angle X-Ray Scattering
- 3. GISAXS and ASAXS
6: Surface Plasmon Resonance (SPR) for Sensors and Biosensors
- Abstract
- 1. Introduction
- 2. Surface Plasmons
- 3. Surface Plasmon Resonance–Based Sensors
- 4. SPR Applications
- 5. Final Remarks
- List of Symbols and Abbreviations
Product details
- No. of pages: 222
- Language: English
- Copyright: © William Andrew 2017
- Published: March 18, 2017
- Imprint: William Andrew
- eBook ISBN: 9780323497794
- Hardcover ISBN: 9780323497787
About the Editors
Osvaldo Novais de Oliveira, Jr
.
Affiliations and Expertise
Ferreira Marystela
Affiliations and Expertise
Fábio Lima Lima Leite
Affiliations and Expertise
Alessandra Luzia Da Róz
Affiliations and Expertise
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