Microbolometers - 1st Edition - ISBN: 9780081028124

Microbolometers

1st Edition

Fundamentals, Materials, and Recent Developments

0.0 star rating Write a review
Authors: Nuggehalli Ravindra Asahel Banobre Sita Marthi
Paperback ISBN: 9780081028124
Imprint: Woodhead Publishing
Published Date: 1st October 2020
Page Count: 200
Sales tax will be calculated at check-out Price includes VAT/GST

Institutional Subscription

Secure Checkout

Personal information is secured with SSL technology.

Free Shipping

Free global shipping
No minimum order.

Table of Contents

1. History
2. Introduction
3. Figure of Merit
4. Materials
5. Honeywell’s Approach
6. Texas Instruments’ Approach
7. Amorphous Silicon
8. Vanadium Oxide
9. Black Metals
10. Other Materials
11. Recent Developments
12. Future Trends
13. Applications
14. Patents


Description

Microbolometers: Fundamentals, Materials, and Recent Developments describes the fundamentals of microbolometers, their historic evolution, operational principles and material choices. It also explains the impact of materials on the processing and development of device characteristics. Sections address various aspects of optical properties and recommend models of properties of materials of interest for the fabrication of the uncooled microbolometers. In addition, the book presents two case studies, Honeywell and Texas Instruments, that focus on the design and manufacture of microbolometers.

Finally, recent developments, applications, patents and future trends are presented. The chapter on patents will summarize the strengths and weaknesses of each of the technologies.

Key Features

  • Describes the fundamentals of uncooled infrared detectors, operational principles and material approaches
  • Includes case studies based on Honeywell and Texas Instruments’ work on microbolometers
  • Provides analyses of current patents with a look towards their strengths and weaknesses

Readership

R&D materials scientists and engineers, those working in academia in materials science, electrical engineering, and physics disciplines


Details

No. of pages:
200
Language:
English
Copyright:
© Woodhead Publishing 2021
Published:
1st October 2020
Imprint:
Woodhead Publishing
Paperback ISBN:
9780081028124

Ratings and Reviews


About the Authors

Nuggehalli Ravindra

N M Ravindra (Ravi) is Professor of Physics at the New Jersey Institute of Technology (NJIT). He was the Chair of the Physics Department (2009–13) and Director, Interdisciplinary Program in Materials Science and Engineering at NJIT (2009–2016).Ravi is the Editor-in-Chief of Emerging Materials Research). He serves on the editorial board of several international journals and book series that are dedicated to materials science and engineering. Ravi and his research team have published over 300 papers in international journals, books and conference proceedings; his team has several pending and two issued patents; he has organized over 30 international conferences; and he has given over 75 talks in international meetings.

Affiliations and Expertise

Department of Physics, New Jersey Institute of Technology, USA

Asahel Banobre

Asahel Bañobre received his BS with Honors and MS in Applied Physics from the New Jersey Institute of Technology (NJIT) in 2003 and 2006, respectively. From 2005 to 2015, Asahel worked as a Test Engineer at Kulite Semiconductor Inc. where he contributed to the optimization and automation of device test procedures and the development of custom product prototypes. Currently, he is pursuing his PhD in Materials Science and Engineering at NJIT. His doctoral study focuses on the design, modeling, fabrication and characterization of uncooled infrared microbolometers. His research interests include semiconductors, MEMS integrated sensors and transducers such as pressure and temperature sensors, and infrared detectors. Asahel is a co-author of Radiative Properties of Semiconductors (Institute of Physics, UK, 2017).

Affiliations and Expertise

Department of Materials Science and Engineering, New Jersey Institute of Technology, USA

Sita Marthi

Sita Rajyalaxmi Marthi (Laxmi) received a BSc in Physics and MSc in Applied Physics from Osmania University, Hyderabad, India, in 2006 and 2009 and a PhD in Materials Science and Engineering at the New Jersey Institute of Technology in December (2017). Her research interests are related to the optical properties of Black silicon, related materials and device structures. Laxmi is a co-author of Radiative Properties of Semiconductors (Institute of Physics, UK, 2017), Black Silicon: Processing, Properties and Applications (Momentum Press, 2016)

Affiliations and Expertise

Department of Materials Science and Engineering, New Jersey Institute of Technology, USA