Hybrid Microcircuit Reliability Data

Hybrid Microcircuit Reliability Data

1st Edition - January 1, 1976

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  • Author: Unknown Author
  • eBook ISBN: 9781483138275

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Description

Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent chapters focus on the screening summary for the hybrid devices, as well as the failure classifications involved. A tabulated test data on the device is also shown. This book will provide helpful data for government and industrial use.

Table of Contents


  • Introduction

    Section 1

    Experienced vs Predicted Failure Rates

    Figure 1 User Experience vs Predicted Failure Rates

    Table 1 User Data

    Section 2

    Screening Summary

    Table 2 Screening Fallout Rejected/Tested

    Table 3 Distribution of Fallouts by Test Method(%)

    Table 4 Rejected/Tested

    Table 5 Normalized Distribution of Fallout(%)

    Table 6 Environmental Sequence Results

    Table 7 Summary of Screening Results

    Section 3

    Failure Classifications

    Table 8 Thin Film Failure Analysis Summary

    Table 9 Thick Film Failure Analysis Summary

    Section 4

    Cross Reference Index

    Section 5

    Detailed Test Data Tabulation

    Beckman Inst. Inc.

    Thick Film Linear

    Centralab (Div of Globe Union)

    Thick Film Resistor Array

    Thick Film Digital

    Circuit Technology Inc.

    Thick Film Digital

    Thick Film Linear

    Collins Radio Co

    Thin Film Digital

    Semiconductor Digital

    Thin Film Linear

    Semiconductor Linear

    Crystalonics

    Thin Film Digital

    CTS Microelectronics

    Thick Film Digital

    Thick Film Linear

    Thick Film N/A

    Dale Electronics Inc

    Thick Film N/A

    Thin Film N/A

    Dupont Electric Prods

    Thick Film N/A

    Electro-Materials Corp.

    Thick Film N/A

    Electronic Communications Inc.

    Thin Film Linear

    Fairchild Semiconductor

    Thin Film Digital

    Thin Film Linear

    Thin Film N/A

    General Instruments

    Thick Film Linear

    GTE Sylvania

    Semiconductor Digital

    Halex

    Thin Film Linear

    Thin Film Digital/Linear

    Hewlett Packard

    Thin Film Digital

    Hughes Aircraft Co.

    Thick Film Linear

    Thin Film Linear

    Intersil Inc.

    Thin Film Digital

    Lockheed Electronics

    Thick Film Digital

    Micro Network Corp

    Thin Film Digital

    Semiconductor Digital

    Motorola Semiconductor

    Thin Film Digital

    Thin Film Linear

    Thick Film Linear

    Semiconductor Linear

    National Semiconductor

    Thick Film Digital

    Thick Film Linear

    Philco Ford Corp

    Thin Film Digital

    Thin Film Linear

    Precision Monolithics

    Thin Film Linear

    Raytheon Corporation

    Thick Film Digital

    SCS Micro Systems

    Semiconductor Digital

    Siliconix

    Thin Film Digital

    Sprague Electric Co

    Semiconductor Digital

    Thin Film Linear

    Thin Film N/A

    Sylvania Electric Prod

    Semiconductor Digital

    Teledyne Philbrick

    Thin Film Linear

    Teledyne Semiconductor (AMELCO)

    Thin Film

    Thin Film Linear

    Texas Instruments

    Thin Film Digital

    Thin Film Linear

    TRW Electronics

    Thick Film Digital

    Proprietary

    Thick Film Digital

    Thin Film Digital

    Semiconductor Digital

    Thick Film Linear

    Thin Film Linear

    Appendix

    Hybrid Microcircuit Descriptor Code Interpretations


Product details

  • No. of pages: 216
  • Language: English
  • Copyright: © Pergamon 1976
  • Published: January 1, 1976
  • Imprint: Pergamon
  • eBook ISBN: 9781483138275

About the Author

Unknown Author

Dr. Sam Stuart is a physiotherapist and a research Fellow within the Balance Disorders Laboratory, OHSU. His work focuses on vision, cognition and gait in neurological disorders, examining how technology-based interventions influence these factors. He has published extensively in world leading clinical and engineering journals focusing on a broad range of activities such as real-world data analytics, algorithm development for wearable technology and provided expert opinion on technology for concussion assessment for robust player management. He is currently a guest editor for special issues (sports medicine and transcranial direct current stimulation for motor rehabilitation) within Physiological Measurement and Journal of NeuroEngineering and Rehabilitation, respectively.

Affiliations and Expertise

Senior Research Fellow, Department of Sport, Exercise and Rehabilitation, Northumbria University, UK Honorary Physiotherapist, Northumbria Healthcare NHS Foundation Trust, North Shields, UK

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