Handbook of Ellipsometry - 1st Edition - ISBN: 9780815514992, 9780815517474

Handbook of Ellipsometry

1st Edition

Editors: Harland Tompkins Eugene A Irene
Authors: Harland Tompkins Eugene A Irene
Hardcover ISBN: 9780815514992
eBook ISBN: 9780815517474
Imprint: William Andrew
Published Date: 6th January 2005
Page Count: 886
Tax/VAT will be calculated at check-out
200.00
325.00
250.00
305.00
Unavailable
Compatible Not compatible
VitalSource PC, Mac, iPhone & iPad Amazon Kindle eReader
ePub & PDF Apple & PC desktop. Mobile devices (Apple & Android) Amazon Kindle eReader
Mobi Amazon Kindle eReader Anything else

Institutional Access


Description

The Handbook of Ellipsometry is a critical foundation text on an increasingly critical subject. Ellipsometry, a measurement technique based on phase and amplitude changes in polarized light, is becoming popular in a widening array of applications because of increasing miniaturization of integrated circuits and breakthroughs in knowledge of biological macromolecules deriving from DNA and protein surface research. Ellipsometry does not contact or damage samples, and is an ideal measurement technique for determining optical and physical properties of materials at the nano scale.

With the acceleration of new instruments and applications now occurring, this book provides an essential foundation for the current science and technology of ellipsometry for scientists and engineers in industry and academia at the forefront of nanotechnology developments in instrumentation, integrated circuits, biotechnology, and pharmaceuticals. Divided into four parts, this comprehensive handbook covers the theory of ellipsometry, instrumentation, applications, and emerging areas. Experts in the field contributed to its twelve chapters, covering various aspects of ellipsometry.

Readership

International scientific and instrumentation communities concerned with thin films, spectroscopic ellipsometry, optical measurement, proteomics (protein chip technology in genomics); theory and applications in thin films materials science including semiconductors.

Table of Contents

PART 1: THEORY OF ELLIPSOMETRY

  1. Polarized Light and Ellipsometry Josef Humlfcek 1.1 A quick guide to ellipsometry 1.2 Maxwell and wave equations 1.3 Representations of polarization 1.4 Propagation of polarized light 1.5 Reflection and transmission of polarized light at planar interfaces 1.6 References
  2. Optical Physics of Materials Robert W. Collins 2.1 Introduction 2.2 Propagation of light in solids 2.3 Classical theories of the optical properties of solids 2.4 Quantum mechanical theories of the optical properties of solids 2.5 Modeling the optical properties of solids 2.6 Overview and concluding remarks 2.7 References and bibliography
  3. Data Analysis for Spectroscopic Ellipsometry Gerald E. Jellison, Jr. 3.1 Introduction 3.2 Ellipsometry parameters 3.3 Calculation of complex reflection coefficients 3.4 Models for dielectric functions 3.5 Fitting models to data 3.6 Determination of optical functions from spectroscopic ellipsometry data 3.7 Depolarization 3.8 Further reading and references

PART 2: INSTRUMENTATION

  1. Optical Components and the Simple PCSA (polarizer, compensator, sample, analyzer) Ellipsometer Harland G. Tompkins 4.1 General 4.2 The components 4.3 Ellipsometer component configurations 4.4 References
  2. Rotating Polarizer and Analyzer Ellipsometry Robert W. Collins, Ilsin An, Chi Chen 5.1 Introduction 5.2 Comparison of ellipsometers 5.3 Instrumentation issues 5.4 Data reduction for the rotating polarizer and analyzer ellipsometers 5.5 Precision considerations 5.6 Calibration procedures 5.7 Summary: recent and future directions
  3. Polarization Modulation Ellipsometry Gerald E. Jellison, Jr., Frank A. Modine 6.1 Introduction 6.2 The photoelastic modulator (PEM) 6.3 Experimental configurations of polarization modulation ellipsometers 6.4 Light intensity through a polarization modulation ellipsometer 6.5 Waveform analysis 6.6 Calibration procedures 6.7 Errors 6.8 Further reading and references
  4. Multichannel Ellipsometry Robert W. Collins, Ilsin An, Joungchel Lee, Juan A. Zapien 7.1 Introduction 7.2 Overview of instrumentation 7.3 Rotating element designs 7.4 Concluding remarks 7.5 References

PART 3: APPLICATIONS

  1. SiO2 Films Eugene A. Irene 8.1 Introduction 8.2 Historical perspectiveùprior to 1970 8.3 Modern studiesùsince 1970 8.4 Conclusions 8.5 References
  2. Theory and Application of Generalized Ellipsometry Mathias Schubert 9.1 Introduction 9.2 The generalized ellipsometry concept 9.3 Theory of generalized ellipsometry 9.4 Special generalized ellipsometry solutions 9.5 Strategies in generalized ellipsometry 9.6 Generalized ellipsometry applications 9.7 Conclusions 9.8 Further reading and references

PART 4: EMERGING AREAS

  1. VUV Ellipsometry James N. Hilfiker 10.1 Introduction 10.2 Historical review of short wavelength ellipsometry 10.3 VUV ellipsometry today 10.4 Importance of VUV ellipsometry 10.5 Survey of applications 10.6 Future of VUV ellipsometry 10.7 Acknowledgments 10.8 References
  2. Spectroscopic Infrared Ellipsometry Arnulf R÷seler 11.1 Introduction 11.2 Experimental tools 11.3 Applications 11.4 References
  3. Ellipsometry in Life Sciences Hans Arwin 12.1 Introduction 12.2 Historical background 12.3 The interfaces under study 12.4 From optics to biology 12.5 Methodology for data evaluation 12.6 Methodologyùexperimental 12.7 Applications 12.8 Outlook 12.9 References

Index

Details

No. of pages:
886
Language:
English
Copyright:
© William Andrew 2005
Published:
Imprint:
William Andrew
eBook ISBN:
9780815517474
Hardcover ISBN:
9780815514992

About the Editor

Harland Tompkins

Affiliations and Expertise

Independent consultant with ties to American Vacuum Society.

Eugene A Irene

Affiliations and Expertise

University of North Carolina, Chapel Hill, USA

About the Author

Harland Tompkins

Affiliations and Expertise

Independent consultant with ties to American Vacuum Society.

Eugene A Irene

Affiliations and Expertise

University of North Carolina, Chapel Hill, USA