Fundamental Principles of Engineering Nanometrology

Fundamental Principles of Engineering Nanometrology

1st Edition - September 3, 2009

Write a review

  • Authors: Richard Leach, Richard Leach
  • eBook ISBN: 9781437778328

Purchase options

Purchase options
DRM-free (PDF, Mobi, EPub)
Sales tax will be calculated at check-out

Institutional Subscription

Free Global Shipping
No minimum order

Description

Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study.

Key Features

  • Provides a basic introduction to measurement and instruments
  • Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force
  • Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal, variable focus, and scattering instruments)
  • Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties)
  • Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge

Readership

Academic and industrial researchers in MNT; Industrial MNT quality control personnel; PhD students in MNT; Post and undergraduate students on MNT courses; materials researchers; Design, manufacturing and measurement engineers

Table of Contents

  • 1. Introduction to metrology for micro- and nanotechnology
    2. Some basics of measurement
    3. Precision measurement instrumentation - some design principles
    4. Length traceability using interferometry
    5. Displacement measurement
    6. Surface topography measurement instrumentation
    7. Scanning probe and particle beam microscopy
    8. Surface topography characterisation
    9. Co-ordinate metrology
    10. Mass and force measurement
    References
    Appendix A SI units of measurement and their realisation at NPL
    Appendix B SI derived units

Product details

  • No. of pages: 352
  • Language: English
  • Copyright: © William Andrew 2009
  • Published: September 3, 2009
  • Imprint: William Andrew
  • eBook ISBN: 9781437778328

About the Authors

Richard Leach

Richard Leach is a Principal Research Scientist in the Mass & Dimensional Group, Industry & Innovati

Affiliations and Expertise

National Physical Laboratory, UK

Richard Leach

Richard Leach is a Principal Research Scientist in the Mass & Dimensional Group, Industry & Innovati

Affiliations and Expertise

National Physical Laboratory, UK

Ratings and Reviews

Write a review

There are currently no reviews for "Fundamental Principles of Engineering Nanometrology"