Formerly Advances in Electronics and Electron Physics
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Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Continuation order customers for either of the original Advances will receiveVolume 90, the first combined volume.
Readership
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Table of Contents
- R. Tolimieri, M. An, Y. Abdelatif, C. Lu, G. Kechriotis, and N. Anupindi, Group Invariant Fourier Transform Algorithms. J.T. Fourie, Crystal-Aperture STEM. N. Nakajima, Phase Retrieval Using the Properties ofEntire Functions. G. Pozzi, Multislice Approach to Lens Analysis. N.K. Tovey, M.W. Hounslow, and J. Wang, Orientation Analysis and Its Applications in Image Analysis. Reference. Subject Index.
Product details
- No. of pages: 338
- Language: English
- Copyright: © Academic Press 1995
- Published: June 5, 1995
- Imprint: Academic Press
- eBook ISBN: 9780080577593
About the Serial Editors
Peter Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and Expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics
Tom Mulvey
Affiliations and Expertise
Aston University, Department of Electronic Engineering and Applied Physics, U.K.
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