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Formerly Advances in Electronics and Electron Physics - 1st Edition - ISBN: 9780120147359, 9780080577593

Formerly Advances in Electronics and Electron Physics, Volume 93

1st Edition

Serial Editors: Peter Hawkes Tom Mulvey
eBook ISBN: 9780080577593
Imprint: Academic Press
Published Date: 5th June 1995
Page Count: 338
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Table of Contents

R. Tolimieri, M. An, Y. Abdelatif, C. Lu, G. Kechriotis, and N. Anupindi, Group Invariant Fourier Transform Algorithms. J.T. Fourie, Crystal-Aperture STEM. N. Nakajima, Phase Retrieval Using the Properties ofEntire Functions. G. Pozzi, Multislice Approach to Lens Analysis. N.K. Tovey, M.W. Hounslow, and J. Wang, Orientation Analysis and Its Applications in Image Analysis. Reference. Subject Index.


Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Continuation order customers for either of the original Advances will receiveVolume 90, the first combined volume.


Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.


No. of pages:
© Academic Press 1995
5th June 1995
Academic Press
eBook ISBN:


@qu:Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf.
@source:--MRS BULLETIN
@qu:With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest.
@source:--J.A. Chapman in LABORATORY PRACTICE

Ratings and Reviews

About the Serial Editors

Peter Hawkes

Peter Hawkes

Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)

Tom Mulvey

Affiliations and Expertise

Aston University, Department of Electronic Engineering and Applied Physics, U.K.