FinFET Modeling for IC Simulation and Design
Using the BSIM-CMG Standard
- 1st Edition - February 18, 2015
- Authors: Yogesh Singh Chauhan, Darsen Lu, Sriramkumar Vanugopalan, Sourabh Khandelwal, Juan Pablo Duarte, Navid Payvadosi, Ali Niknejad, Chenming Hu
- Language: English
- Hardback ISBN:9 7 8 - 0 - 1 2 - 4 2 0 0 3 1 - 9
- eBook ISBN:9 7 8 - 0 - 1 2 - 4 2 0 0 8 5 - 2
This book is the first to explain FinFET modeling for IC simulation and the industry standard – BSIM-CMG - describing the rush in demand for advancing the technology from planar to… Read more
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Request a sales quoteThis book is the first to explain FinFET modeling for IC simulation and the industry standard – BSIM-CMG - describing the rush in demand for advancing the technology from planar to 3D architecture, as now enabled by the approved industry standard.
The book gives a strong foundation on the physics and operation of FinFET, details aspects of the BSIM-CMG model such as surface potential, charge and current calculations, and includes a dedicated chapter on parameter extraction procedures, providing a step-by-step approach for the efficient extraction of model parameters.
With this book you will learn:
Why you should use FinFET
The physics and operation of FinFET
Details of the FinFET standard model (BSIM-CMG)
Parameter extraction in BSIM-CMG
FinFET circuit design and simulation
- Authored by the lead inventor and developer of FinFET, and developers of the BSIM-CM standard model, providing an experts’ insight into the specifications of the standard
- The first book on the industry-standard FinFET model - BSIM-CMG
1. FinFET- from Device Concept to Standard Compact Model2. Analog/RF behavior of FinFET3. Core Model for FinFETs4. Channel Current and Real Device Effects5. Leakage Current Models6. Charge, Capacitance and Nonquasi-Static Effect7. Parasitic Resistances and Capacitances8. Noise9. Junction Diode Current and Capacitance10. Benchmark tests for Compact Models11. BSIM-CMG Model Parameter Extraction12. Temperature Effects
- No. of pages: 304
- Language: English
- Edition: 1
- Published: February 18, 2015
- Imprint: Academic Press
- Hardback ISBN: 9780124200319
- eBook ISBN: 9780124200852
YC
Yogesh Singh Chauhan
Yogesh Singh Chauhan is a Professor at the Indian Institute of Technology Kanpur. His research interests include the physics, characterization, and modeling of nanoscale semiconductor devices, and RF circuit design. He is the developer of several industry standard models, including the BSIM-BULK (BSIM6), BSIM-IMG, BSIM-CMG and ASM-HEMT models.
DL
Darsen Lu
SV
Sriramkumar Vanugopalan
SK
Sourabh Khandelwal
JD
Juan Pablo Duarte
NP
Navid Payvadosi
AN
Ali Niknejad
CH