Experimental Methods

Experimental Methods

Treatise on Materials Science and Technology, Vol. 19

1st Edition - March 28, 1980

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  • Editor: Herbert Herman
  • eBook ISBN: 9781483218267

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Description

Treatise on Materials Science and Technology, Volume 19: Experimental Methods, Part A covers the methods of materials experimentation and testing. The book discusses the measurement of residual stresses by x-ray diffraction techniques; the investigation of composition variations by diffraction; and the use of Mössbauer spectroscopy in materials science. The text also describes photoluminescence techniques for studies of composition and defects in semiconductors; and materials production by high-rate sputter deposition. Graduate students in the field of materials science, laboratory scientists, and materials engineers will find the book invaluable.

Table of Contents


  • List of Contributors

    Foreword

    Preface

    1 The Measurement of Residual Stresses by X-Ray Diffraction Techniques

    I. Introduction

    II. Types of Residual Stresses

    III. Principles of X-Ray Stress Measurement

    IV. Control of Accuracy and Precision

    V. Fundamental Problems

    VI. Applications

    References

    2 The Investigation of Composition Variations by Diffraction

    I. Introduction

    II. Diffraction Equations

    III. Penetration Distance

    IV. Effective Volume Calculations

    V. Two Methods of Analyzing for Composition Profile

    VI. Choice of Binary System for Composition Broadening Studies

    VII. Analysis of Rocking Curve Data

    VIII. Influence of Temperature Diffuse Scattering

    IX. Determinations of Composition Profiles

    X. Summary

    3 The Use of Mössbauer Spectroscopy in Materials Science

    I. Introduction

    II. General Principles of Mössbauer Spectroscopy

    III. Instrumentation

    IV. Measurements on Substitutional Alloys

    V. Interstitial Alloys

    VI. Magnetic Studies

    VII. Phase Analysis

    VIII. Summary

    References

    4 Photoluminescence Techniques for Studies of Composition and Defects in Semiconductors

    I. Introduction

    II. Equipment for Photoluminescence Experiments

    III. Profiling of Bulk Properties of Semiconductors with Photoluminescence

    IV. Some Applications of Photoluminescence in the Exploration of Properties of Point Defects in Semiconductors

    V. Studies of Dislocation-Related Defects in Semiconductors with Photoluminescence Techniques References

    5 Materials Production by High Rate Sputter Deposition

    I. Introduction

    II. High Rate Sputtering Systems

    III. Sputter-Deposition Techniques

    IV. Sputter-Deposited Materials

    References

    Index


Product details

  • No. of pages: 276
  • Language: English
  • Copyright: © Academic Press 1980
  • Published: March 28, 1980
  • Imprint: Academic Press
  • eBook ISBN: 9781483218267

About the Editor

Herbert Herman

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