Diffraction and Imaging Techniques in Material Science P2

Diffraction and Imaging Techniques in Material Science P2

Imaging and Diffraction Techniques

2nd Edition - January 1, 1978

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  • Editor: S Amelinckx
  • eBook ISBN: 9780444601865

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Description

Diffraction and Imaging Techniques in Material Science reviews recent developments in diffraction and imaging techniques used in the study of materials. It discusses advances in high-voltage electron microscopy, low-energy electron diffraction (LEED), X-ray and neutron diffraction, X-ray topography, mirror electron microscopy, and field emission microscopy. Organized into five parts encompassing nine chapters, this volume begins with an overview of the dynamical theory of the diffraction of high-energy electrons in crystals and methodically introduces the reader to dynamical diffraction in perfect and imperfect crystals, inelastic scattering of electrons in crystals, and X-ray production. It then explores back scattering effects, the technical features of high-voltage electron microscopes, and surface characterization by LEED. Other chapters focus on the kinematical theory of X-ray diffraction, techniques and interpretation in X-ray topography, and interpretation of the contrast of the images of defects on X-ray topographs. The book also describes theory and applications of mirror electron microscopy, surface studies by field emission of electrons, field ionization and field evaporation, and gas-surface interactions before concluding with a discussion on lattice imperfections. Scientists and students taking courses on diffraction and solid-state electron microscopy will benefit from this book.

Table of Contents


  • Preface to the first edition

    Preface to the second edition

    Contents

    Volume I: Electron Microscopy

    Introduction

    General review of the experimental methods for the determination of

    atomic clusters

    Transmission Electron Microscopy

    Kinematical theory of electron diffraction

    Dynamical theory of electron diffraction

    The study of planar interfaces by means of electron microscopy

    The weak-beam method of electron microscopy

    Identification of small defect-clusters in particle-irradiated crystals by means of transmission electron microscopy

    Some applications of transmission electron microscopy to phase transitions

    Martensitic transformations: Electron microscopy and diffraction studies

    Computed electron micrographs and their use in defect identification

    Direct structure imaging in electron microscopy

    Particular Aspects of Electron Diffraction

    Kikuchi electron diffraction and applications

    Study of substitution order-disorder by means of X-ray and electron diffraction

    Volume II: Imaging and Diffraction Techniques

    High Voltage Electron Microscopy

    The theory of high energy electron diffraction

    Recent progress in high voltage electron microscopy

    Low Energy Electron Diffraction

    Surface characterization by low energy electron diffraction

    X-Ray and Neutron Diffraction and Topography

    Advances in X-ray and neutron diffraction techniques

    Techniques and interpretation in X-ray topography

    Contrast of images in X-ray topography

    Mirror Electron Microscopy

    Mirror electron microscopy theory and applications

    Field Emission Microscopy

    Surface studies by field emission

    Developments in field ion microscopy

    Subject index




Product details

  • No. of pages: 412
  • Language: English
  • Copyright: © Elsevier 1978
  • Published: January 1, 1978
  • Imprint: Elsevier
  • eBook ISBN: 9780444601865

About the Editor

S Amelinckx

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