Selected articles. Atomic ordering and phase separation. Bonding theories. Chalcopyrite semiconductors. Characterization of compound semiconductors by etching. Chemical vapor deposition of dielectric and metal films. Connector materials. Defects in epitaxial layers. Defects in silicon: fundamentals. Defects in silicon: processing. Diluted magnetic semiconductors. Dislocations in semiconductors. Electrical laminates. Electronic and optical minerals. Epitaxial metal - semiconductor interfaces. Fine-line lithography. Fine-line metrology. Flip-chip interconnections. Fluorescence properties of materials. Grain boundaries in semiconductors. Growth of semiconductor bulk single crystals. Hydrogen in crystalline semiconductors. Interlevel dielectrics and passivating films. Laser glass. Laser materials. Liquid crystals. Liquid phase epitaxy. Local vibrational mode spectroscopy of semiconductors. Mechanical properties of semiconductors. Molecular beam epitaxy. Multilevel metallization. Organic "soft" thin-film transistor. Organometallic vapor phase epitaxy. Oxygen in Czochralski silicon. Quantum wells. Quantum wells: intrinsic optical properties. Schottky barriers. Semiconductor heterostructures: formation of defects and their reduction. Silicon carbide. Silicon dioxide: bulk properties. Silicon nitride: bulk properties. Silicon-on-insulator film growth. Silicon: properties and materials specifications. Silicon semiconductor devices and integrated circuit processing. Solid conductors. Sputtering. Stress- and current-induced damage in thin-film conductors. Thermoelectric semiconductors. Transmission electron microscopy of semiconductors.