Basics of Interferometry

2nd Edition

Authors: P. Hariharan
Hardcover ISBN: 9780123735898
eBook ISBN: 9780080465456
Imprint: Academic Press
Published Date: 9th October 2006
Page Count: 248
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Description

Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more consise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography.

Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. This new edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons.

Key Features

Outstanding introduction to the world of optical interferometry with summaries at the begining and end of each chapter, several appendices with essential information, and worked numerical problems Practical details enrich understanding for readers new to this material *New chapters on white-light microscopy for medical imaging and interference with single photons(quantum optics)

Readership

Optical and photonic engineers, researchers, and students; communications engineers; MEMS engineers; biomedical engineers; astronomists; structural engineers

Table of Contents

Chapter 1: Introduction Chapter 2: Interference: A Primer Chapter 3: Two-Beam Interferometers Chapter 4: Source-Size and Spectral Effects Chapter 5: Multiple-Beam Interference Chapter 6: The Laser as a Light Source Chapter 7: Photodetectors Chapter 8: Measurements of Length Chapter 9: Optical Testing Chapter 10: Digital Techniques Chapter 11: Macro- and Micro-Interferometry Chapter 12: White-Light Interference Microscopy Chapter 13: Holographic and Speckle Interferometry Chapter 14: Interferometric Sensors Chapter 15: Interference Spectroscopy Chapter 16: Fourier-Transform Spectroscopy Chapter 17: Interference with Single Photons Chapter 18: Building an Interferometer Appendix A: Monochromatic Light Waves Appendix B: Phase Shifts on Reflections Appendix C: Diffraction Appendix D: Polarized Light Appendix E: The Pancharatnam Phase Appendix F: The Twyman-Green Interferometer: Initial Adjustment Appendix G: The Mach-Zehnder Interferometer: Initial Adjustment

Details

No. of pages:
248
Language:
English
Copyright:
© Academic Press 2007
Published:
Imprint:
Academic Press
eBook ISBN:
9780080465456
Hardcover ISBN:
9780123735898

About the Author

P. Hariharan

Professor P. Hariharan is a Research Fellow in the Division of Telecommunications and Industrial Physics of CSIRO in Sydney and a Visiting Professor at the University of Sydney. His main research interests are interferometry and holography. He is a Fellow of SPIE (The International Society for Optical Engineering), the Optical Society of America (OSA), the Institute of Physics, London, and the Royal Photographic Society. He was a vice-president and then the treasurer of the International Commission of Optics, as well as a director of SPIE. Honors he has received include OSA’s Joseph Fraunhofer Award, the Henderson Medal of the Royal Photographic Society, the Thomas Young Medal of the Institute of Physics, London, SPIE’s Dennis Gabor Award and, most recently, SPIE’s highest award, the Gold Medal.

Affiliations and Expertise

School of Physics, University of Sydney, Sydney, Australia