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Advances in Imaging and Electron Physics
1st Edition, Volume 199 - March 15, 2017
Editor: Peter W. Hawkes
Language: English
Hardback ISBN:9780128120910
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eBook ISBN:9780128121948
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Advances in Imaging and Electron Physics, Volume 199, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances…Read more
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Advances in Imaging and Electron Physics, Volume 199, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices). Specific topics include discussions on Micro-XRF in scanning electron microscopes, and an interesting take on the variational approach for simulation of equilibrium ion distributions in ion traps regarding Coulomb interaction, amongst others. Users will find a comprehensive resource on the most important aspects of particle optics at high and low energies, microlithography, image science and digital image processing.
In addition, topics of interest, including electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains are presented and discussed.
Contains contributions from leading authorities on the subject matter
Informs and updates on all the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Chapter One: Micro-XRF in Scanning Electron Microscopes
Abstract
1 Introduction
2 Differences and Synergies of SEM-EDS and μ-XRF
3 Design of an Microspot X-Ray Source for SEM
4 Performing a Measurement
5 Applications
6 Summary
Chapter Two: A Variational Approach for Simulation of Equilibrium Ion Distributions in Ion Traps With Regard to Coulomb Interaction
Abstract
1 Introduction
2 Physical Grounds of the Simulation Method
3 Simulation Results
4 Conclusion
Acknowledgment
Chapter Three: Analytical Review of Direct Stem Imaging Techniques for Thin Samples
Abstract
1 Introduction
2 Linear CBED COM STEM Imaging Techniques
3 STEM Imaging Techniques Using a Symmetric Scalar Detector
4 STEM Imaging Using an Antisymmetric Vector Detector: iDPC
5 Experimental Results Using iDPC-STEM Imaging
6 Summary and Conclusions
Acknowledgments
Appendix A Resolution of STEM Imaging
Appendix B Derivation of the Ideal, Linear COM STEM Vector Image Formation Formula
Appendix C Derivation of the General, Nonlinear STEM Image Formation Formula
Appendix D CTFs for Aberration-Free MIDI-STEM
Appendix E Determination of the Scaling Factors in the Fourier Series in Azimuthal Direction for Wedge-Shaped DPC Detectors
Appendix F CTFiS and CTFiC for the COM-STEM Detector
Appendix G List of Abbreviations
Chapter Four: Quantum Nanooptics in the Electron Microscope
Abstract
1 Introduction
2 Quantum Optics
3 Primary Excitations in Bulk and Quantum-Confined Materials
4 CL Phenomenon
5 Single-Photon Detection in the Electron Microscope
6 Light Bunching in CL
7 Lifetime Measurements at the Nanometer Scale
8 Perspectives
Acknowledgments
Chapter Five: Component Identification and Interpretation: A Perspective on Tower of Knowledge
Abstract
1 Introduction
2 Component Identification by a Voting Method
3 Component Interpretation by ToK
4 Conclusions
No. of pages: 324
Language: English
Edition: 1
Volume: 199
Published: March 15, 2017
Imprint: Academic Press
Hardback ISBN: 9780128120910
eBook ISBN: 9780128121948
PH
Peter W. Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France
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