Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

1st Edition - August 25, 2017

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  • Editor: Peter Hawkes
  • eBook ISBN: 9780128121917
  • Hardcover ISBN: 9780128120880

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Description

Advances in Imaging and Electron Physics, Volume 202, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

Key Features

  • Contains contributions from leading authorities on the subject matter
  • Informs and updates on all the latest developments in the field of imaging and electron physics
  • Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron and ion emission with a valuable resource
  • Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Table of Contents

  • 1. Non-Negative Sparse Mathematical Morphology
    Jesús Angulo and Santiago Velasco-Forero
    2. Disorder Modifications of the Critical Temperature for Superconductivity – A Perspective from the Point of View of Nanoscience
    Clifford M. Krowne
    3. The Struggle to Overcome Spherical Aberration in Electron Optics
    Albert Septier

Product details

  • No. of pages: 166
  • Language: English
  • Copyright: © Academic Press 2017
  • Published: August 25, 2017
  • Imprint: Academic Press
  • eBook ISBN: 9780128121917
  • Hardcover ISBN: 9780128120880

About the Serial Editor

Peter Hawkes

Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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