Advances in Imaging and Electron Physics, Volume 196
1st Edition
Table of Contents
- Preface
- Future Contributions
- Chapter One: Quantum Entanglement in Photon-Induced Electron Spectroscopy of Atoms and Molecules: Its Generation, Characterization, and Applications
- Abstract
- 1 Introduction
- 2 Basics of Quantum Information
- 3 Entanglement in Electron Optics of Atoms
- 4 Entanglement in Electron Optics of Molecules
- 5 Conclusions
- Acknowledgments
- Appendix A Some of the Well-Known Bipartite and Tripartite States of Qubits and Their Important Properties
- Appendix B Density Matrices for Coulombic Entanglement Generated in Some of the Processes (4)–(9)
- Appendix C Density Matrices for Fine-Structure Entanglement Generated in Some of the Processes (4)–(9)
- Chapter Two: Voltage Contrast Modes in a Scanning Electron Microscope and Their Application
- Abstract
- 1 Introduction
- 2 Sensitivity and Transfer Function of Potential Relief Measurements in a SEM
- 3 Method of Field Contrast (Trajectory Sensitive Contrast Technique)
- 4 The Potential Contrast Methods
- 5 Methods of Eliminating Factors Contributing to the Measurement Errors of Local Potential and the Resolution Deterioration
- 6 Fundamentals of Dynamic Potential Contrast Methods and Their Applications
- 7 Measurements Using Potential Contrast in a SEM
- 8 Conclusions and Outlook
- Chapter Three: A Review of Scanning Electron Microscopy in Near Field Emission Mode
- Abstract
- 1 Introduction
- 2 Instrumentation
- 3 Geometric Influence on Field Emission
- 4 Primary Electron Beam Generation
- 5 Topographic Imaging
- 6 Alternative Contrast Mechanisms
- 7 Conclusions
- Acknowlegments
- Appendix A Detector Calibration
- Appendix B Comparison of reff vs rphys
- Index
- Contents of Volumes 151-195
Description
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Key Features
- Contains contributions from leading authorities on the subject matter
- Informs and updates with all the latest developments in the field of imaging and electron physics
- Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
- Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
Readership
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Details
- No. of pages:
- 358
- Language:
- English
- Copyright:
- © Academic Press 2016
- Published:
- 26th September 2016
- Imprint:
- Academic Press
- eBook ISBN:
- 9780128052280
- Hardcover ISBN:
- 9780128048122
Ratings and Reviews
About the Authors
Peter Hawkes Author
Peter Hawkes graduated from the University of Cambridge and subsequently obtained his PhD in the Electron Microscopy Section of the Cavendish Laboratory. He remained there for several years, working on electron optics and digital image processing before taking up a research position in the CNRS Laboratory of Electron Optics (now CEMES-CNRS) in Toulouse, of which he was Director in 1987. During the Cambridge years, he was a Research Fellow of Peterhouse and a Senior Research fellow of Churchill College. He has published extensively, both books and scientific journal articles, and is a member of the editorial boards of Ultramicroscopy and the Journal of Microscopy. He was the founder-president of the European Microscopy Society, CNRS Silver Medallist in 1983 and is a Fellow of the Optical Society of America and of the Microscopy Society of America (Distinguished Scientist, Physics, 2015), Fellow of the Royal Microscopical Society and Honorary Member of the French Microscopy Society. In 1982, he was awarded the ScD degree by the University of Cambridge.
In 1982, he took over editorship of the Advances in Electronics & Electron Physics (now Advances in Imaging & Electron Physics) from Claire Marton (widow of the first editor, Bill Marton) and followed Marton's example in maintaining a wide range of subject matter. He added mathematical morphology to the topics regularly covered; Jean Serra and Gerhard Ritter are among those who have contributed.
In 1980, he joined Professor Wollnik (Giessen University) and Karl Brown (SLAC) in organising the first international conference on charged-particle optics, designed to bring together opticians from the worlds of electron optics, accelerator optics and spectrometer optics. This was so successful that similar meetings have been held at four-year intervals from 1986 to the present day. Peter Hawkes organised the 1990 meeting in Toulouse and has been a member of the organising committee of all the meetings. He has also participated in the organization of other microscopy-related congresses, notably EMAG in the UK and some of the International and European Congresses on electron microscopy as well as three Pfefferkorn conferences.
He is very interested in the history of optics and microscopy, and recently wrote long historical articles on the correction of electron lens aberrations, the first based on a lecture delivered at a meeting of the Royal Society. He likewise sponsored biographical articles for the Advances on such major figures as Ernst Ruska (Nobel Prize 1986), Helmut Ruska, Bodo von Borries, Jan Le Poole and Dennis Gabor (Nobel Prize, 1971). Two substantial volumes of the series were devoted to 'The Beginnings of Electron Microscopy' and 'The Growth of Electron Microscopy'. and others have covered 'Cold Field Emission Scanning Transmission Electron Microscopy' and 'Aberration-corrected Electron Microscopy', with contributions by all the main personalities of the subject.
Affiliations and Expertise
Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), Toulouse, France