Advances in Imaging and Electron Physics, Volume 196

• Preface
• Future Contributions
• Chapter One: Quantum Entanglement in Photon-Induced Electron Spectroscopy of Atoms and Molecules: Its Generation, Characterization, and Applications
  • Abstract
  • 1 Introduction
  • 2 Basics of Quantum Information
  • 3 Entanglement in Electron Optics of Atoms
  • 4 Entanglement in Electron Optics of Molecules
  • 5 Conclusions
  • Acknowledgments
  • Appendix A Some of the Well-Known Bipartite and Tripartite States of Qubits and Their Important Properties
  • Appendix B Density Matrices for Coulombic Entanglement Generated in Some of the Processes (4)–(9)
  • Appendix C Density Matrices for Fine-Structure Entanglement Generated in Some of the Processes (4)–(9)
• Chapter Two: Voltage Contrast Modes in a Scanning Electron Microscope and Their Application
  • Abstract
  • 1 Introduction
  • 2 Sensitivity and Transfer Function of Potential Relief Measurements in a SEM
  • 3 Method of Field Contrast (Trajectory Sensitive Contrast Technique)
  • 4 The Potential Contrast Methods
  • 5 Methods of Eliminating Factors Contributing to the Measurement Errors of Local Potential and the Resolution Deterioration
  • 6 Fundamentals of Dynamic Potential Contrast Methods and Their Applications
  • 7 Measurements Using Potential Contrast in a SEM
  • 8 Conclusions and Outlook
• Chapter Three: A Review of Scanning Electron Microscopy in Near Field Emission Mode
  • Abstract
  • 1 Introduction
  • 2 Instrumentation
  • 3 Geometric Influence on Field Emission
  • 4 Primary Electron Beam Generation
  • 5 Topographic Imaging
  • 6 Alternative Contrast Mechanisms
  • 7 Conclusions
  • Acknowlegments
  • Appendix A Detector Calibration
  • Appendix B Comparison of reff vs rphys
• Index
• Contents of Volumes 151-195

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contains contributions from leading authorities on the subject matter
• Informs and updates with all the latest developments in the field of imaging and electron physics
• Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
• Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general