Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

1st Edition - July 17, 2014

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  • Editor: Peter Hawkes
  • Hardcover ISBN: 9780128001448
  • eBook ISBN: 9780128003084

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Description

Advances in Imaging & Electron Physics merges two long-running serials—Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading authorities
  • Informs and updates on all the latest developments in the field

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general.

Table of Contents

    • Editor-In-Chief
    • Preface
    • Future Contributions
    • Chapter One. Gaussian Beam Propagation in Inhomogeneous Nonlinear Media: Description in Ordinary Differential Equations by Complex Geometrical Optics
      • 1. Introduction
      • 2. CGO: Fundamental Equations, Main Assumptions, and Boundary of Applicability
      • 3. Gaussian Beam Diffraction in Free Space. CGO Method and Classical Diffraction Theory
      • 4. On-Axis Propagation of an Axially Symmetric Gaussian Beam in Smoothly Inhomogeneous Media
      • 5. Generalization of the CGO Method for Nonlinear Inhomogeneous Media
      • 6. Self-Focusing of an Axially Symmetric Gaussian Beam in a Nonlinear Medium of the Kerr Type. The CGO Method and Solutions of the Nonlinear Parabolic Equation
      • 7. Self-Focusing of Elliptical GB Propagating in a Nonlinear Medium of the Kerr Type
      • 8. Rotating Elliptical Gaussian Beams in Nonlinear Media
      • 9. Orthogonal Ray-Centered Coordinate System for Rotating Elliptical Gaussian Beams Propagating Along a Curvilinear Trajectory in a Nonlinear Inhomogeneous Medium
      • 10. Complex Ordinary Differential Riccati Equations for Elliptical Rotating GB Propagating Along a Curvilinear Trajectory in a Nonlinear Inhomogeneous Medium
      • 11. Ordinary Differential Equation for the Complex Amplitude and Flux Conservation Principle for a Single Rotating Elliptical GB Propagating in a Nonlinear Medium
      • 12. Generalization of the CGO Method for N-Rotating GBS Propagating Along a Helical Ray in Nonlinear Graded-Index Fiber
      • 13. Single-Rotating GB. Evolution of Beam Cross Section and Wave-Front Cross Section
      • 14. Pair of Rotating GBS
      • 15. Three- and Four-Rotating GBS
      • 16. Conclusion
    • Chapter Two. Single-Particle Cryo-Electron Microscopy (Cryo-EM): Progress, Challenges, and Perspectives for Further Improvement
      • 1. Introduction
      • 2. Going Beyond Large Particles with High Symmetry: Defining the Problem
      • 3. Perspectives for Further Improvement of Single-Particle Cryo-EM
      • 4. Summary: High-Resolution Structure Analysis by Cryo-EM Seems to be Rapidly Approaching its Full Potential
    • Chapter Three. Morphological Amoebas and Partial Differential Equations
      • 1. Introduction
      • 2. Discrete Amoeba Algorithms
      • 3. Continuous Amoeba Filtering
      • 4. Space-Continuous Analysis of Amoeba Filters
      • 5. Presmoothing and Amoeba Filters
      • 6. Experiments
      • 7. Conclusion
      • Appendix
    • Contents of Volumes 151-184
      • Volume 151
      • Volume 152
      • Volume 153
      • Volume 154
      • Volume 155
      • Volume 156
      • Volume 157
      • Volume 158
      • Volume 159
      • Volume 160
      • Volume 161
      • Volume 162
      • Volume 163
      • Volume 164
      • Volume 165
      • Volume 166
      • Volume 167
      • Volume 168
      • Volume 169
      • Volume 170
      • Volume 171
      • Volume 172
      • Volume 173
      • Volume 174
      • Volume 175
      • Volume 176
      • Volume 177
      • Volume 178
      • Volume 179
      • Volume 180
      • Volume 181
      • Volume 182
      • Volume 183
      • Volume 184
    • Index
    • Color plates

Product details

  • No. of pages: 262
  • Language: English
  • Copyright: © Academic Press 2014
  • Published: July 17, 2014
  • Imprint: Academic Press
  • Hardcover ISBN: 9780128001448
  • eBook ISBN: 9780128003084

About the Serial Editor

Peter Hawkes

Peter Hawkes
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

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