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Advances in Imaging and Electron Physics - 1st Edition - ISBN: 9780123813183, 9780123813190

Advances in Imaging and Electron Physics, Volume 161

1st Edition

Optics of Charged Particle Analyzers

Serial Editor: Peter Hawkes
Hardcover ISBN: 9780123813183
eBook ISBN: 9780123813190
Paperback ISBN: 9780323282017
Imprint: Academic Press
Published Date: 10th March 2010
Page Count: 304
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Table of Contents

  1. Charged particles in electromagnetic fields

    2. Language of aberration expansions in charged particle optics

    3. Transporting charged particle beams in static fields

    4. Transporting charged particles in radiofrequency fields

    5. Static magnetic charged particle analyzers

    6. Electrostatic energy analyzers

    7. Mass analyzers with combined electrostatic and magnetic fields

    8. Time-of-flight mass analyzers

    9. Radiofrequency mass analyzers

Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Key Features

  • Contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Invaluable reference and guide for physicists, engineers and mathematicians

Readership

Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general


Details

No. of pages:
304
Language:
English
Copyright:
© Academic Press 2010
Published:
10th March 2010
Imprint:
Academic Press
Hardcover ISBN:
9780123813183
eBook ISBN:
9780123813190
Paperback ISBN:
9780323282017

Ratings and Reviews


About the Serial Editor

Peter Hawkes

Peter Hawkes

Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)