
Advances in Imaging and Electron Physics
Theory of Intense Beams of Charged Particles
Description
Key Features
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
Readership
Table of Contents
- Beam equations
- Exact solutions to the beam equations
- Anti-paraxial expansions
- Solution of the beam formation problem in 3D case
- Asymptotic theory of 3D flows
- Geometrized theory
- Examples of applications
Product details
- No. of pages: 752
- Language: English
- Copyright: © Academic Press 2011
- Published: June 11, 2011
- Imprint: Academic Press
- Hardcover ISBN: 9780123813107
- eBook ISBN: 9780123813114
About the Serial Editor
Peter Hawkes

Affiliations and Expertise
Ratings and Reviews
Latest reviews
(Total rating for all reviews)
Dr.VIKRAM R. Sun Jan 26 2020
Advances in Imaging and Electron Physics
very use full book for research in Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.This book extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Key Features Contributions from leading international scholars and industry experts Discusses hot topic areas and presents current and future research trends Invaluable reference and guide for physicists, engineers and mathematicians