Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

The Scanning Transmission Electron Microscope

1st Edition - November 5, 2009
There is a Newer Edition Available
  • Editor: Peter Hawkes
  • eBook ISBN: 9780080961583

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Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.  This particular volume presents several timely articles on the scanning transmission electron microscope.

Key Features

  • Updated with contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Provides an invaluable reference and guide for physicists, engineers and mathematicians
  • Readership

    Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

    Table of Contents

    • Albert V. Crewe, The beginnings and development of the scanning transmission electron microscope (STEM)

      Andreas Engel, STEM in the life sciences

      Peter Hawkes, The AEI and Siemens STEM instruments

      Hiromi Inada, STEM in Japan

      Michael S. Isaacson, Early work on the STEM

      Bernard Jouffrey, The Toulouse high-voltage STEM project

      Ondrej Krivanek, Aberration-corrected STEM

      K.C.A. Smith, STEM in Cambridge

      Lyn Swanson and Greg Schwind, A review of the cold field electron cathode

      Sebastian von Harrach, STEM in Oxford and at Vacuum Generators

      Ian Wardell and Peter Bovey, The Vacuum Generators STEM

      Joseph Wall, Historical background of the STEM at Brookhaven National Laboratory

    Product details

    • No. of pages: 320
    • Language: English
    • Copyright: © Academic Press 2009
    • Published: November 5, 2009
    • Imprint: Academic Press
    • eBook ISBN: 9780080961583

    About the Serial Editor

    Peter Hawkes

    Peter Hawkes
    Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

    Affiliations and Expertise

    Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France