Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.  This particular volume presents several timely articles on the scanning transmission electron microscope.

Key Features

  • Updated with contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Provides an invaluable reference and guide for physicists, engineers and mathematicians
  • Readership

    Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

    Table of Contents

    Albert V. Crewe, The beginnings and development of the scanning transmission electron microscope (STEM)

    Andreas Engel, STEM in the life sciences

    Peter Hawkes, The AEI and Siemens STEM instruments

    Hiromi Inada, STEM in Japan

    Michael S. Isaacson, Early work on the STEM

    Bernard Jouffrey, The Toulouse high-voltage STEM project

    Ondrej Krivanek, Aberration-corrected STEM

    K.C.A. Smith, STEM in Cambridge

    Lyn Swanson and Greg Schwind, A review of the cold field electron cathode

    Sebastian von Harrach, STEM in Oxford and at Vacuum Generators

    Ian Wardell and Peter Bovey, The Vacuum Generators STEM

    Joseph Wall, Historical background of the STEM at Brookhaven National Laboratory


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    © 2009
    Academic Press
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