Advances in Imaging and Electron Physics
The Scanning Transmission Electron Microscope
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Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope.
Key Features
Readership
Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general
Table of Contents
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Albert V. Crewe, The beginnings and development of the scanning transmission electron microscope (STEM)
Andreas Engel, STEM in the life sciences
Peter Hawkes, The AEI and Siemens STEM instruments
Hiromi Inada, STEM in Japan
Michael S. Isaacson, Early work on the STEM
Bernard Jouffrey, The Toulouse high-voltage STEM project
Ondrej Krivanek, Aberration-corrected STEM
K.C.A. Smith, STEM in Cambridge
Lyn Swanson and Greg Schwind, A review of the cold field electron cathode
Sebastian von Harrach, STEM in Oxford and at Vacuum Generators
Ian Wardell and Peter Bovey, The Vacuum Generators STEM
Joseph Wall, Historical background of the STEM at Brookhaven National Laboratory
Product details
- No. of pages: 320
- Language: English
- Copyright: © Academic Press 2009
- Published: November 5, 2009
- Imprint: Academic Press
- eBook ISBN: 9780080961583
About the Serial Editor
Peter Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Affiliations and Expertise
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics
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