Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.  This particular volume presents several timely articles on the scanning transmission electron microscope.

Key Features

  • Updated with contributions from leading international scholars and industry experts
  • Discusses hot topic areas and presents current and future research trends
  • Provides an invaluable reference and guide for physicists, engineers and mathematicians
  • Readership

    Physicists, electrical engineers and applied mathematicians in all branches of image processing and microscopy as well as electron physics in general

    Details

    No. of pages:
    320
    Language:
    English
    Copyright:
    © 2009
    Published:
    Imprint:
    Academic Press
    Print ISBN:
    9780123749864
    Electronic ISBN:
    9780080961583