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- Future Contributions
- GENERAL CONSIDERATIONS
- Chapter I: Basic Field Equations
- 1.1 MAXWELL’S EQUATIONS
- 1.2 ELECTROMAGNETIC POTENTIALS
- 1.3 VARIATIONAL PRINCIPLES
- 1.4 WAVE EQUATIONS AND HERTZ VECTORS
- 1.5 BOUNDARY CONDITIONS
- 1.6 INTEGRAL EQUATIONS FOR ELECTROSTATIC FIELDS
- 1.7 INTEGRAL EQUATIONS FOR MAGNETIC FIELDS
- 1.8 INTEGRAL EQUATIONS FOR WAVE FIELDS
- Chapter II: Reducible Systems
- 2.1 AZIMUTHAL FOURIER-SERIES EXPANSIONS
- 2.2 ROTATIONALLY SYMMETRIC BOUNDARIES
- 2.3 MAGNETIC ROUND LENSES
- 2.4 SERIES EXPANSIONS
- 2.5 PLANAR FIELDS
- Chapter III: Basic Mathematical Tools
- 3.1 ORTHOGONAL COORDINATE SYSTEMS
- 3.2 INTERPOLATION AND NUMERICAL DIFFERENTIATION
- 3.3 MODIFIED INTERPOLATION KERNELS
- 3.4 MATHEMATICAL REPRESENTATION OF CURVES
- 3.5 MATHEMATICAL REPRESENTATION OF SURFACES
- 3.6 NUMERICAL INTEGRATION
- Chapter IV: The Finite-Difference Method (FDM)
- 4.1 TWO-DIMENSIONAL MESHES
- 4.2 FIVE-POINT CONFIGURATIONS
- 4.3 NINE-POINT CONFIGURATIONS
- 4.4 THE CYLINDRICAL POISSON EQUATION
- 4.5 IRREGULAR CONFIGURATIONS
- 4.6 SUBDIVISION OF MESHES
- 4.7 CONCLUDING REMARKS
- Chapter V: The Finite-Element Method (FEM)
- 5.1 GENERATION OF MESHES
- 5.2 DISCRETIZATION OF THE VARIATIONAL PRINCIPLE
- 5.3 ANALYSIS IN TRIANGULAR ELEMENTS
- 5.4 THE FINITE-ELEMENT METHOD IN FIRST ORDER
- 5.5 FIELD INTERPOLATION
- 5.6 SOLUTIONS OF LARGE SYSTEMS OF EQUATIONS
- Chapter VI: The Boundary Element Method
- 6.1 DISCRETIZATION OF INTEGRAL EQUATIONS
- 6.2 AXIALLY SYMMETRIC INTEGRAL EQUATIONS
- 6.3 NUMERICAL SOLUTION OF INTEGRAL EQUATIONS
- 6.4 SPECIAL TECHNIQUES FOR ASYMMETRIC INTEGRAL EQUATIONS
- 6.5 THE CALCULATION OF EXTERNAL FIELDS
- 6.6 OTHER APPLICATIONS OF INTEGRAL EQUATIONS
- Chapter VII: Hybrid Methods
- 7.1 COMBINATION OF THE FEM WITH THE BEM
- 7.2 COMBINATION OF THE FDM WITH THE BEM
- 7.3 THE CHARGE SIMULATION METHOD (CSM)
- 7.4 THE CURRENT SIMULATION MODEL
- 7.5 THE GENERAL ALTERNATION METHOD
- 7.6 FAST FIELD CALCULATION
- 7.7 Calculation of Equipotentials
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
- No. of pages:
- © Academic Press 2001
- 15th June 2001
- Academic Press
- Hardcover ISBN:
- eBook ISBN:
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE
Professor Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peter House and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES)
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