Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

1st Edition - September 17, 1999

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  • Editor-in-Chief: Peter Hawkes
  • eBook ISBN: 9780080577753

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Description

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Readership

Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.

Table of Contents

    • Preface
    • Forthcoming Contributions
    • Development and Applications of a New Deep Level Transient Spectroscopy Method and New Averaging Techniques
      • I INTRODUCTION
      • II REVIEW OF THE DEEP-LEVEL TRANSIENT SPECTROSCOPY METHOD
      • III AVERAGING AND RECORDING OF DIGITAL DLTS TRANSIENT SIGNALS
      • IV FEEDBACK CIRCUITS AND EXPERIMENTAL SETUP FOR CC-DLTS AND CR-DLTS
      • V Constant-Resistance DLTS in Enhancement Mode Mosfets
      • VI CONSTANT-RHSISTANCE DLTS IN DEPLETION MODE MOSFETS
      • VII CONSTANT-RESISTANCE DLTS IN JUNCTION FIELD-EFFECT TRANSISTORS
      • VIII CONCLUSIONS AND AREAS FOR FUTURE RESEARCH
      • ACKNOWLEDGMENTS
      • List of Acronyms
      • List of Symbols
      • APPENDIX A: MAGNITUDE ERRORS
      • APPENDIX B: TIME CONSTANT ERRORS
      • APPENDIX C: NOISE SOURCES AND SIGNAL-TO-NOISE RATIO IN THE DLTS TRANSIENTS
      • APPENDIX D: ELECTRICAL CIRCUIT OF THE PSEUDO-LOGARITHMIC GENERATOR
      • APPENDIX E: ELECTRICAL CIRCUIT OF THE FEEDBACK CIRCUIT
      • APPENDIX F: LISTING OF A TEMPLATE FOR A DLTS MEASUREMENT PROGRAM
      • APPENDIX G: LISTING OF A TEMPLATE FOR A DLTS ANALYSIS PROGRAM
      • APPENDIX H: RADIATION-INDUCED DEFECTS IN SILICON
    • Complex Dyadic Multiresolution Analyses
      • ABSTRACT
      • I INTRODUCTION
      • II THE SPLINE EXAMPLE
      • III MULTIRESOLUTION AND WAVELET
      • IV DAUBECHIES’ WAVELETS
      • V SYMMETRIC DAUBECHIES WAVELETS
      • VI THE PHASE OF SDW SCALING FUNCTION
      • VII THE MALLAT ALGORITHM WITH COMPLEX FILTERS
      • VIII RESTORATION FROM THE PHASE
      • IX IMAGE ENHANCEMENT
      • X COMPLEX SHRINKAGE
      • XI CONCLUSION
      • ACKNOWLEDGMENTS
    • Lattice Vector Quantization for Wavelet-Based Image Coding
      • I INTRODUCTION
      • II QUANTIZATION OF WAVKLET COEFFICIENTS
      • III LATTICE QUANTIZATION FUNDAMENTALS
      • IV LATTICES
      • V QUANTIZATION ALGORITHMS FOR SELECTED LATTICES
      • VI COUNTING THE LATTICE POINTS
      • VII SCALING ALGORITHM
      • VIII SELECTING A LATTICE FOR QUANTIZATION
      • IX ENTROPY CODING OF LATTICE VECTORS
      • X EXPERIMENTAL RESULTS
      • XI CONCLUSIONS
      • APPENDIX A: CARTAN MATRICES OF SOME ROOT SYSTEMS
    • Fuzzy Cellular Neural Networks and Their Applications to Image Processing
      • I INTRODUCTION
      • II FUZZY CELLULAR NEURAL NETWORKS
      • III THEORY OF FUZZY CELLULAR NEURAL NETWORKS
      • IV FCNN AS COMPUTATIONAL ARRAYS
      • V EMBED LINGUISTIC STATEMENTS INTO FCNN
      • VI. LEARNING ALGORITHMS OF FCNN
      • VII GENERIC ALGORITHM FOR FCNN
      • VIII APPLICATIONS OR DISCRETE-TIME FCNN
      • IX CONCLUSIONS AND FUTURE WORK
    • Index

Product details

  • No. of pages: 453
  • Language: English
  • Copyright: © Academic Press 1999
  • Published: September 17, 1999
  • Imprint: Academic Press
  • eBook ISBN: 9780080577753

About the Editor in Chief

Peter Hawkes

Peter Hawkes
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Affiliations and Expertise

Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique (CEMES), France

About the Serial Editors

Benjamin Kazan

Affiliations and Expertise

Xerox Corporation, Palo Alto, California, U.S.A.

Tom Mulvey

Affiliations and Expertise

Aston University, Department of Electronic Engineering and Applied Physics, U.K.

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