Advances in Imaging and Electron Physics, Volume 106

1st Edition

Hardcover ISBN: 9780120147489
eBook ISBN: 9780080577722
Imprint: Academic Press
Published Date: 18th February 1999
Page Count: 353
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Table of Contents

M.J. Deen, T.D. Hardy, and R. Murowinski, Effects of Radiation Damage on Scientific Charge Coupled Devices. C.M. Krowne, CAD Using Green's Functions and Finite Elements and Comparison to Experimental Structures for Inhomogeneous Microstrip Circulators. S. Marchard-Maillet and S. Antipolis, Discrete Geometry to Image Processing. H. Ozaktas, M.A. Kutay, and D. Mendlovi, Introduction to the Fractional Fourier Transform and Its Applications. E.H.K. Stelzer and F.M. Haar, Confocal Microscopy. Subject Index.


Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.


Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.


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© Academic Press 1999
Academic Press
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@from:Praise for the Series @qu:"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf." @source:--MRS BULLETIN @qu:"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest." @source:--J.A. CHAPMAN in LABORATORY PRACTICE