Advanced Topics in Forensic DNA Typing: Methodology

Advanced Topics in Forensic DNA Typing: Methodology

1st Edition - July 21, 2011

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  • Author: John Butler
  • Hardcover ISBN: 9780123745132
  • eBook ISBN: 9780123878236

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Description

Intended as a companion to the Fundamentals of Forensic DNA Typing volume published in 2009, Advanced Topics in Forensic DNA Typing: Methodology contains 18 chapters with 4 appendices providing up-to-date coverage of essential topics in this important field and citation to more than 2800 articles and internet resources. The book builds upon the previous two editions of John Butler’s internationally acclaimed Forensic DNA Typing textbook with forensic DNA analysts as its primary audience.  This book provides the most detailed information written to-date on DNA databases, low-level DNA, validation, and numerous other topics including a new chapter on legal aspects of DNA testing to prepare scientists for expert witness testimony. Over half of the content is new compared to previous editions. A forthcoming companion volume will cover interpretation issues.

Key Features

  • Contains the latest information - hot-topics and new technologies
  • Well edited, attractively laid out, and makes productive use of its four-color format
  • Author John Butler is ranked as the number one "high-impact author in legal medicine and forensic science, 2001 to 2011" by ScienceWatch.com

Readership

Researchers and practitioners in forensic DNA analysis, forensic scientists, population geneticists, military and private and public forensic laboratories (for identifying individuals through remains), and students of forensic science. Law enforcement, legal professionals, government/legal policy makers.

Table of Contents

  • Dedication

    Foreword

    Introduction

    Acknowledgments

    About the Author

    Chapter 1. Sample Collection, Storage, and Characterization

    Chapter 2. DNA Extraction Methods

    Chapter 3. DNA Quantitation

    Chapter 4. PCR Amplification

    Chapter 5. Short Tandem Repeat (STR) Loci and Kits

    Chapter 6. Capillary Electrophoresis

    Chapter 7. Quality Assurance and Validation

    Chapter 8. DNA Databases

    Chapter 9. Missing Persons and Disaster Victim Identification Efforts

    Chapter 10. Degraded DNA

    Chapter 11. Low-Level DNA Testing

    Chapter 12. Single Nucleotide Polymorphisms and Applications

    Chapter 13. Y-Chromosome DNA Testing

    Chapter 14. Mitochondrial DNA Analysis

    Chapter 15. X-Chromosome Analysis

    Chapter 16. Non-human DNA

    Chapter 17. New Technologies and Automation

    Chapter 18. Legal Aspects of DNA Testing and the Scientific Expert in Court

    Appendix 1. Reported Sizes and Sequences of STR Alleles

    Appendix 2. Familial DNA Searches: Potential, Pitfalls, and Privacy Concerns

    Appendix 3. List of Suppliers for DNA Instruments, Reagents, Services

    Appendix 4. Interviews Supporting Legal Aspects of DNA Testing

    Subject Index

Product details

  • No. of pages: 708
  • Language: English
  • Copyright: © Academic Press 2011
  • Published: July 21, 2011
  • Imprint: Academic Press
  • Hardcover ISBN: 9780123745132
  • eBook ISBN: 9780123878236

About the Author

John Butler

John Butler
John M. Butler is a NIST Fellow and Special Assistant to the Director for Forensic Science, Office of Special Programs, at the U.S. National Institute of Standards and Technology, in Gaithersburg, Maryland. Dr. Butler earned his PhD from the University of Virginia while doing DNA research in the FBI Laboratory's Forensic Science Research Unit. He has won numerous scientific awards, including being named Science Watch’s #1 world-wide high-impact author in legal medicine and forensic science over the last decade (July 2011). He has over 150 publications in this field and is a frequent presenter on the topic of DNA typing, and has authored four other DNA Typing books including Advanced Topics in Forensic DNA Typing: Methodology. For a detailed CV, visit http://www.cstl.nist.gov/strbase/butler.htm.

Affiliations and Expertise

National Institute of Standards and Technology (NIST), Gaithersburg, MD, USA

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