A Review: Ultrahigh-Vacuum Technology for Electron Microscopes

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes

1st Edition - February 15, 2020

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  • Author: Nagamitsu Yoshimura
  • eBook ISBN: 9780128197035
  • Paperback ISBN: 9780128185735

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Description

A Review: Ultrahigh-Vacuum Technology for Electron Microscopes provides information on the fundamentals of ultra-high vacuum systems. It covers the very subtle process that can help increase pressure inside the microscope (or inside any other ultra-high vacuum system) and the different behavior of the molecules contributing to this kind of process. Prof Yoshimura’s book offers detailed information on electron microscope components, as well as UHV technology. This book is an ideal resource for industrial microscopists, engineers and scientists responsible for the design, operation and maintenance of electron microscopes. In addition, engineering students or engineers working with electron microscopes will find it useful.

Key Features

  • Teaches how to incorporate diffusion pumps for UHV electron microscopy
  • Presents the work of an author who brings a lifetime of experience working on vacuum technology and electron microscopes

Readership

Industrial microscopists, Engineers and scientists responsible for the design, operation and maintenance of electron microscopes, engineering students or engineers working in a laboratory equipped with an electron microscope

Table of Contents

  • 1. Phenomena Induced by Fine Electron-Probe Irradiation
    2. Electron Induced Gas Desorption
    3. Microdischarges in High Vacuum
    4. Sputter-Ion Pump (SIP) for Extreme-High-Vacuum Use
    5. Development of Diffusion Pump (DP) System for Electron Microscopes

Product details

  • No. of pages: 568
  • Language: English
  • Copyright: © Academic Press 2020
  • Published: February 15, 2020
  • Imprint: Academic Press
  • eBook ISBN: 9780128197035
  • Paperback ISBN: 9780128185735

About the Author

Nagamitsu Yoshimura

In 1965 he graduated from Osaka Prefecture University, Engineering Division and immediately began working for JEOL LTD. In 1985 he received a Doctor of Engineering degree from Osaka Prefecture University. His Ph.D. Thesis was on “Research and Development of High-Vacuum System of Electron Microscopes” (in Japanese). In 1995 he qualified as a consultant engineer in the field. From 1965 to 2002 he engaged in research and development of vacuum-related technology in electron microscopes for more than 35 years at JEOL-group companies. He retired in 2002. He has authored 2 books for Springer.

Affiliations and Expertise

Formerly, Japan Electron Optics Laboratory (JEOL)

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