Secure CheckoutPersonal information is secured with SSL technology.
Free ShippingFree global shipping
No minimum order.
A Review: Ultrahigh-Vacuum Technology for Electron Microscopes provides information on the fundamentals of ultra-high vacuum systems. It covers the very subtle process that can help increase pressure inside the microscope (or inside any other ultra-high vacuum system) and the different behavior of the molecules contributing to this kind of process. Prof Yoshimura’s book offers detailed information on electron microscope components, as well as UHV technology. This book is an ideal resource for industrial microscopists, engineers and scientists responsible for the design, operation and maintenance of electron microscopes. In addition, engineering students or engineers working with electron microscopes will find it useful.
- Teaches how to incorporate diffusion pumps for UHV electron microscopy
- Presents the work of an author who brings a lifetime of experience working on vacuum technology and electron microscopes
Industrial microscopists, Engineers and scientists responsible for the design, operation and maintenance of electron microscopes, engineering students or engineers working in a laboratory equipped with an electron microscope
- Phenomena Induced by Fine Electron-Probe Irradiation
2. Electron Induced Gas Desorption
3. Microdischarges in High Vacuum
4. Sputter-Ion Pump (SIP) for Extreme-High-Vacuum Use
5. Development of Diffusion Pump (DP) System for Electron Microscopes
- No. of pages:
- © Academic Press 2020
- 19th February 2020
- Academic Press
- Paperback ISBN:
- eBook ISBN:
In 1965 he graduated from Osaka Prefecture University, Engineering Division and immediately began working for JEOL LTD. In 1985 he received a Doctor of Engineering degree from Osaka Prefecture University. His Ph.D. Thesis was on “Research and Development of High-Vacuum System of Electron Microscopes” (in Japanese). In 1995 he qualified as a consultant engineer in the field. From 1965 to 2002 he engaged in research and development of vacuum-related technology in electron microscopes for more than 35 years at JEOL-group companies. He retired in 2002. He has authored 2 books for Springer.
Formerly, Japan Electron Optics Laboratory (JEOL)
Elsevier.com visitor survey
We are always looking for ways to improve customer experience on Elsevier.com.
We would like to ask you for a moment of your time to fill in a short questionnaire, at the end of your visit.
If you decide to participate, a new browser tab will open so you can complete the survey after you have completed your visit to this website.
Thanks in advance for your time.