Quantitative Data Processing in Scanning Probe Microscopy
SPM Applications for Nanometrology
- Petr Klapetek, Czech Metrology Institute
Despite tremendous advances in Scanning Probe Microscopy (SPM) over the last twenty years, its potential as a quantitative measurement tool have not been fully realized, due to challenges such as the complexity of tip/sample interaction. In this book, Petr Klapetek uses the latest research to unlock SPM as a toolkit for nanometrology in fields as diverse as nanotechnology, surface physics, materials engineering, thin film optics, and life sciences. Klapetek's considerable experience of Quantitive Data Processing, using software tools, enables him to not only explain the microscopy techniques, but also to demystify the analysis and interpretation of the data collected.
In addition to the essential principles and theory of SPM metrology, Klapetek provides readers with a number of worked examples to demonstrate typical ways of solving problems in SPM analysis. Source data for the examples as well as most of the described open source software tools are available on a companion website.
AudienceIndustrial and academic engineers and scientists working in nanotechnology, surface physics, materials engineering, thin film optics, life sciences, etc; SPM users and technicians; engineers and scientists utilizing SPM data
- Published: November 2012
- Imprint: WILLIAM ANDREW
- ISBN: 978-1-4557-3058-2
Table of Contents
Introduction to SPM; Data models; Basic SPM data processing; Dimensional measurements; Mechanical properties; Local current measurements; Electric and magnetic measurements; Thermal measurements; Optical measurements.