Optical Diagnostics for Thin Film ProcessingBy
- Irving Herman
This book is a good introduction for novices in the field and a valuable resource handbook for those with experience. The primary audience includes: academic and industrial researchers, scientists, technicians and engineers inthin film processing, spectroscopy, optical diagnostics, electrical engineering, materials science, and condensed matter physics. The book is also useful for optical scientists, applied physicists, chemists, and materials scientists. In addition, it can serve as a teaching text for graduate courses, society-sponsored short courses (such as AVS, MRS, SPIE, and ECS meetings), and on-site training courses at industrial fabrication facilities. It will especially be of interest to those in the United States,Western Europe, and Japan.
Hardbound, 783 Pages
Published: October 1995
Imprint: Academic Press
"The greatest value of
Optical Diagnostics for Thin Film Processingis a comprehensive reference text. I highly recommend it to anyone who wants to seriously delve into the field of thin film optical diagnostics or wants a single source book of well-organized and very high-density information on this subject."
--William G. Breiland, Sandia National Laboratories, OPTICAL ENGINEERING.