The Spectroscopy of Semiconductors

The Spectroscopy of Semiconductors

1st Edition - July 7, 1992

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  • Editors: Robert Willardson, Eicke Weber, Albert Beer
  • eBook ISBN: 9780080864334

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Description

Spectroscopic techniques are among the most powerful characterization methods used to study semiconductors. This volume presents reviews of a number of major spectroscopic techniques used to investigate bulk and artificially structured semiconductors including: photoluminescence, photo-reflectance, inelastic light scattering, magneto-optics, ultrafast work, piezo-spectroscopy methods, and spectroscopy at extremely low temperatures and high magnetic fields. Emphasis is given to major semiconductor systems, and artificially structured materials such as GaAs, InSb, Hg1-xCdxTe and MBE grown structures based upon GaAs/AlGaAs materials. Both the spectroscopic novice and the expert will benefit from the descriptions and discussions of the methods, principles, and applications relevant to today's semiconductor structures.

Key Features

@introbul:Key Features
@bul:* Discusses the latest advances in spectroscopic techniques used to investigate bulk and artificially structured semiconductors
* Features detailed review articles which cover basic principles
* Highlights specific applications such as the use of laser spectroscopy for the characterization of GaAs quantum well structures

Readership

Electrical engineers, materials scientists, physicists, and industrial scientists, particularly researchers and technicians in the semiconductor industry.

Table of Contents

  • D. Heiman, Laser Spectroscopy of Semiconductors at Low Temperatures and High Magnetic Fields. A.V. Nurmikko, Transient Spectroscopy by Ultrashort Laser Pulse Techniques. A.K. Ramdas and S. Rodriguez, Piezospectroscopy of Semiconductors. O.J. Glembocki and B.V. Shanabrook, Photoreflectance Spectroscopy of Microstructures. D.G. Seiler, C.L. Littler, and M.H. Weiler, One- and Two-Photon Magneto-Optical Spectroscopy of InSb and Hg1-xCdxTe. Each chapter includes references. Index.

Product details

  • No. of pages: 435
  • Language: English
  • Copyright: © Academic Press 1992
  • Published: July 7, 1992
  • Imprint: Academic Press
  • eBook ISBN: 9780080864334

About the Serial Editors

Robert Willardson

Affiliations and Expertise

WILLARDSON CONSULTING SPOKANE, WASHINGTON

Eicke Weber

Affiliations and Expertise

Fraunhofer-Institut für Solare Energiesysteme ISE, Freiburg, Germany

Albert Beer

Affiliations and Expertise

CONSULTING PHYSICIST COLUMBUS, OHIO

About the Serial Volume Editors

Christopher Littler

Affiliations and Expertise

University of North Texas

David Seiler

Affiliations and Expertise

National Institute of Standards and Technology

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