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ADVANCES IN IMAGING AND ELECTRON PHYSICS, 130
Advances in Imaging and Electron Physics, 130To order this title, and for more information, click here

By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France

Included in series
Advances in Imaging and Electron Physics,

Description
The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.

Audience
Researchers, academics, physicists and engineers working in the field of image and electron physics

Contents
Chapter 1 – Statistical Experimental?, (Van DYCK et al) Chapter 2 - Transform-Based.., (GRIGORYAN/AGAIAN) Chapter 3 – Image Registration (PETROU)

Bibliographic & ordering Information
Hardbound, 315 pages, publication date: MAY-2004
ISBN-13: 978-0-12-014772-4
ISBN-10: 0-12-014772-6
Imprint: ACADEMIC PRESS
Price: Order form
GBP 110
USD 215
EUR 160

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Last update: 18 Jul 2008
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