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| ADVANCES IN IMAGING AND ELECTRON PHYSICS, 127
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 To order this title, and for more information, click here
Edited By
Peter Hawkes, CEMES/Laboratoire d'Optique Electronique du Centre National de la Recherche Scientifique, Toulouse, France
Included in series
Advances in Imaging and Electron Physics,
Description
The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding.
This volume concentrates on microscopy and pattern recognition and also electron physics.
The text bridges the gap between academic
researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
Audience
Researchers, academics, physicists and engineers working in the field of image and electron physics
Contents
Scanning Nonlinear Dielectric Microscopy; High Order Accurate Methods in Time-Domain Computational Electromagnetics; Pre filtering for
Pattern Recognition Using Wavelet Transform and Neural Networks; Electron Optics and Electron Microscopy: Conference Proceedings and
Abstracts as source Material.
Bibliographic & ordering Information
Hardbound, 407 pages, publication date: JUL-2003
ISBN-13: 978-0-12-014769-4
ISBN-10: 0-12-014769-6
Imprint: ACADEMIC PRESS
Price: Order form
GBP 110
USD 215
EUR 160
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Last update: 15 Jul 2008
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