 |
| (Guest)editors | | Volume & journal title |
|
| |
| Vol. 69, no. 2-4: |
| NGCM 2002 |
|
| ( 559 pages ) |
|
| |
|
| ( 511 pp ) |
|
| |
|
| ( 328 ) |
|
| H. Ahmed, J.R.A. Cleaver, G.A.C. Jones et al. | |
| Vol. 11: |
| Microcircuit Engineering 89 |
|
| ( xx + 708 pages ) |
|
| T. Ando, C. Hamaguchi, S. Namba | |
| Vol. 47, no. 1-4: |
| NPMS 98 - New Phenomena in Mesoscopic Structures |
|
| ( 452 pages ) |
|
| T. Ando, C. Hamaguchi | |
| Vol. 63, no. 1-3: |
| NMPS 2001, New Phenomena in Mesoscopic Structures |
|
| ( 318 pages ) |
|
| P. Balk, J.J.M. de Nijs | |
|
| ( 436 pages ) |
|
| J. Bausells, G. Abadal, F. Perez-Murano | |
|
| ( 1155 pages ) |
|
| S.P. Beaumont, C.D.W. Wilkinson | |
| Vol. 35: |
| Micro– and Nano– Engineering 96 |
|
| ( 598 pages ) |
|
| A. Birolini, M. Ciappa, E. Wolfgang | |
| Vol. 24: |
| Electron and Optical Beam Testing of Electronic Devices |
|
| ( 456 pages ) |
|
| G. Bomchil, D. Célier, R. Madar et al. | |
|
| ( 612 pages ) |
|
| J. Brugger, J. Gobrecht, H. Rothuizen et al. | |
|
| ( 990 pages ) |
|
| S. Cristoloveanu, N. Gillemot | |
|
| ( 508 pages ) |
|
| S. Cristoloveanu, J. Boussey | |
|
| ( 286 pages ) |
|
| G. Declerck, K. de Meyer | |
| Vol. 10, no. 3/4: |
| Semiconductor Manufacturing Science |
|
| ( ii + 172 pages ) |
|
| G. Declerck, L. Van den Hove, F. Coopmans | |
| Vol. 13: |
| Microcircuit Engineering 90 |
|
| ( xviii + 574 pages ) |
|
| R. De Keersmaecker | |
| Vol. 34, no. 1/2: |
| Jessi Basic &Long–Term Research Advanced CMOS Cluster Workshop, Brussels, Belgium, 29–30 March 1995 |
|
| ( 142 pages ) |
|
| G. de Santi, G. Ottaviani | |
| Vol. 55, no.1-4: |
| MAM 2000 |
|
| ( 418 pages ) |
|
| A. Dimoulas, P. Normand | |
|
| ( 596 ) |
|
| S. Fan, Y. Han, Z. L. Wang et al. | |
| Vol. 66, no 1-4: |
| IUMRS-ICEM2002 |
|
| ( 952 pages ) |
|
| O. Fortagne, D. P. Kern, U. Behringer | |
|
| ( 1,066 pages ) |
|
| H. Fußstetter, H. Richter, M. Umeno | |
| Vol. 56, no.1-2: |
| Proceedings of the E-MRS IUMRS ICEM 2000 Meeting |
|
| ( 232 pages ) |
|
| M. Gentili | |
| Vol. 34, no. 3/4: |
| Microfabrication of Differactive Optical Elements |
|
| ( 128 pages ) |
|
| M. Gentili, E. Di Fabrizio, G. Meneghini | |
| Vol. 53, no. 1-4: |
| MNE '99 |
|
| ( 712 pages ) |
|
| T. Gessner, J. Torres, G. Crean | |
| Vol. 33: |
| Advanced Materials for Interconnections |
|
| ( 464 pages ) |
|
| G. Ghibaudo, J. Boussey | |
|
| ( 198 pages ) |
|
| M. Hatzakis, E. Gogolides | |
| Vols. 41/42: |
| Micro– and Nano– Engineering 97 |
|
| ( 668 pages ) |
|
| M. Henini | |
|
| ( 780 pages ) |
|
| M. Henini | |
|
| ( 744 pages ) |
|
| M. Ilegems, M. Dutoit | |
| Vol. 15: |
| Solid State Device Research 91 |
|
| ( xxiv + 698 pages ) |
|
| O. Joubert, J. Perrocheau, S. Tedesco | |
|
| ( 1,138 pages ) |
|
| A. Kristensen, A. Boisen | |
|
| ( 750 ) |
|
| E. Kubalek, E. Wolfgang | |
| Vol. 12: |
| Electron and Optical Beam Testing of Integrated Circuits |
|
| ( xii + 446 pages ) |
|
| P.K. Larsen, G.J.M. Dormans | |
|
| ( 354 pages ) |
|
| H.W. Lehmann, U. Staufer, P. Vettiger | |
| Vol. 27: |
| Micro– and Nano– Engineering 94 |
|
| ( 582 pages ) |
|
| H. Loeschner | |
|
| ( 1277 pages ) |
|
| H.E. Maes, R.P. Mertens, R.J. Van Overstraeten | |
| Vol. 19: |
| Solid State Device Research 92 |
|
| ( xxxviii + 932 pages ) |
|
| M. Melgara, E. Wolfgang, B. Courtois et al. | |
| Vol. 16: |
| Electron and Optical Beam Testing of Integrated Circuits |
|
| ( xii + 534 pages ) |
|
| Y.I. Nissim, G.W. Rubloff, A. Katz | |
| Vol. 25, no. 2/4: |
| Integrated Processing for Micro and Optoelectronics |
|
| ( 292 pages ) |
|
| F. Paschke, W. Fallmann, H. Löschner | |
| Vol. 9: |
| Microcircuit Engineering 88 |
|
| ( xviii + 654 pages ) |
|
| J. Perrocheau | |
| Vol. 30: |
| Micro– and Nano– Engineering 95 |
|
| ( 646 pages ) |
|
| S. Radelaar, J. Romijn, E. van der Drift | |
| Vol. 23: |
| International Conference on Microfabrication |
|
| ( 512 pages ) |
|
| G. Reimbold, J. Boussey | |
| Vol. 49, no. 1-2: |
| Migas International Summer school on Advanced Microelectronics-Grenoble |
|
| ( 204 pages ) |
|
| Rusli, C-C. Tin, H. Matsunami et al. | |
|
| ( 192 pages ) |
|
| H. Ryssel, D. Stephani | |
| Vol. 21: |
| Microcircuit Engineering 92 |
|
| ( 516 pages ) |
|
| E. Sangiorgi, L. Selmi | |
| Vol. 59, no. 1-4: |
| INFOS 2001 |
|
| ( 526 pages ) |
|
| D. Schmitz, H. Jürgensen | |
| Vol. 18, no. 1/2: |
| MOVPE for Opto– and Microelectronics |
|
| ( viii + 206 pages ) |
|
| M. Schulz, R. Brendel | |
| Vol. 48, no. 1-4: |
| Insulating films on semiconductors |
|
| ( 450 pages ) |
|
| O. Thomas, H. Dallaporta, P. Gas | |
| Vol. 70, no. 2-4: |
| MAM 2003 |
|
| ( 445 pages ) |
|
| A. Tucciarone, A. Paoletti, P. Paroli | |
| Vol. 17: |
| Microcircuit Engineering 91 |
|
| ( xviii + 582 pages ) |
|
| L. Van den hove, K. Ronse, M. Van Rossum | |
| Vol. 46, no. 1-4: |
| Micro– and Nano– Engineering 98 |
|
| ( 530 pages ) |
|
| A. Vantomme, M. de Potter, M. Baklanov et al. | |
| Vol. 50, no. 1-4: |
| Proceedings of the Third European Workshop on Materials for Advanced Metallization Ostende, Belgium, March 7-10, 1999 |
|
| ( 566 pages ) |
|
| P. Vettiger, U. Staufer, D.P. Kern | |
|
| ( 426 pages ) |
|
| E. Wolfgang, B. Courtois, L.J. Balk | |
| Vol. 31: |
| Electron and Optical Beam Testing of Electronic Devices |
|
| ( 444 pages ) |
|
| W. Zapka | |
| Vol. 20, no. 1/2: |
| Laser Processing in Microelectronics |
|
| ( 190 pages ) |
|
| S.-L. Zhang, M. Õstling | |
| Vol. 60, no 1-2: |
| MAM 2001 |
|
| ( 294 pages ) |
|
