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MICROELECTRONICS RELIABILITY
Former title: Microelectronics and Reliability
Special issues & Supplements
Sort listing by:
Volume
(Guest) editor
(43 special issues and supplements)
(Guest)editorsVolume & journal title
A. Wymyslowski, A. Dziedzic
Volume 48, Number 6:
Thermal, Mechanical and Multi-physics Simulation and Experiments in Micro-electronics and Micro-systems
( 153 )
M. Pecht, P. Sandborn, A. Wymyslowski
Volume 47, Number 12:
Electronic system prognostics and health management
( 444 Pages )
P. Ersland, R. Menozzi
Volume 46, Issue 8:
Microelectronic Reliability : 2005 ROCS Workshop
( 184 )
N. Labat, T. Touboul
Volume 45, Issues 9-11:
Proceedings of the 16th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis
( 532 )
P. Hurley
Volume 45, Numbers 5-6:
Dielectrics in Microelectronics (WoDiM 2004)
W. Stadler
Volume 45, Number 2:
Special Section on ESD
T. Brozek, E. Vincent
Volume 45, Number 1:
Special Section Negative-Bias-Temperature Instability (NBTI) in Mos Devices
D. Andersson, B. Vandevelde
Volume 44, Number 12:
Special Section on Eurosime Package and Solder Joint Reliability Analysed by Fem Simulation and Experiments
M. Ciappa, W. Fichtner
Volume 44, Numbers 9-11:
Reliability of Electron Devices, Failure Physics and Analysis
R.-P. Vollertsen
Volume 44, Number 8:
Special Section on Fast Wafer Level Reliability: Methods and Experiences
P. Ershand, R. Menozzi
Volume 44, Number 7:
Special Section on 2003 GaAs Reliability Workshop
M. Estrada, O. Martinez, J. Santana
Volume 44, Number 4:
Special Section on Iberchip Workshop
N. Labat, A. Touboul
Volume 43, Numbers 9–11:
Reliability of Electron Devices, Failure Physics and Analysis
G. Ghibaudo, E. Vincent
Volume 43, Number 8:
Special Section on Dielectrics in Microelectronics (WoMiD 2002)
I. De Wolf, H.A. Gieser
Volume 43, Number 7:
Special Section on Papers from the 2002 Symposium on Electrical Overstress/Electrostatic Discharge (EOS/ESD) and MEMS Reliability
W.T. Anderson, R. Menozzi
Volume 43, Number 6:
Special Section on 2002 GaAs Reliability Workshop
V. Benda
Volume 43, Number 4:
Special Section on 6th International Seminar on Power Semiconductors (ISPS '02)
A. Dziedzic
Volume 43, Number 3:
Special Section on IMAPS-Europe 2002
M. Estrada, J. Santana
Volume 43, Number 2:
Special Section on Iberchip Workshop
F. Fantini, M. Vanzi
Volume 42, Numbers 9–11:
Reliability of Electron Devices, Failure Physics and Analysis
W.T. Anderson, R. Menozzi
Volume 42, Number 7:
Special Section on 2001 GaAs Reliability Workshop
M.P.J. Mergens, W. Wondrak
Volume 42, Number 6:
Special Sections on Reliability of Passive Component
M.G. Pecht, N.D. Stojadinović
Volume 42, Numbers 4–5:
40th Anniversary Special Issue
M.P.J. Mergens
Volume 41, Number 11:
Special Section: Papers Selectred from the 2000 Symposium on Electrical Overstress/Electrostatic Discharge (EOS/ESD)
N. Labat, A. Touboul
Volume 41, Numbers 9–10:
Reliability of Electron Devices, Failure Physics and Analysis
W.T. Anderson, D.L. Barton, R. Menozzi et al.
Volume 41, Number 8:
Special Sections on Papers Presented at the 200 GaAs Reliability Workshop and Advanced Failure Analysis
A. Martin
Volume 41, Number 7:
Dielectrics in Microelectronics
Y. Danto, P. Lall, A.O. Tay
Volume 40, Number 7:
Microelectronic Packaging and Assembling
H. Wong, C. Surya
Volume 40, Number 11:
Noise in Microelectronic Devices and Systems
L.J. Balk, W.H. Gerling, E. Wolfgang
Volume 40, Numbers 8–10:
Reliabilty of Electron Devices, Failure Physics and Analysis
B. Garrido, J.R. Morante
Volume 40, Numbers 4–5:
Dielectrics in Microelectronics
F. Fantini, J.J. Liou, M. Fukuda
Volume 39, Number 12:
Reliability of Compound Semiconductor Devices and Integrated Circuits
S.H. Voldman, A.J. Mouthaan, H. Onoda
Volume 39, Number 11:
Papers Presented at the 1998 Symposium on Electrical Overstress/Electrostatic Discharge (EOS/ESD)and Current Issues in Metal Migration
N. Labat, A. Touboul
Volume 39, Numbers 6–7:
Reliability of Electron Devices, Failure Physics and Analysis
K.G. Verhaege
Volume 38, Number 11:
Papers Presented at the 1997 Symposium on Electrical Overstress/Electrostatic Discharge (EOS/ESD)
H. Wong
Volume 38, Number 9:
Advances in Submicron MOS Devices and Technology
F. Jensen, C. Kjærgaard
Volume 38, Number 6-8:
Reliability of Electron Devices, Failure Physics and Analysis
A. Paccagnella, E. Zanoni
Volume 38, Number 2:
Dielectrics in Microelectronics
G. Groeseneken, H.E. Maes, A.J. Mouthaan et al.
Volume 36, Number 11/12:
Reliability of Electron Devices, Failure Physics and Analysis (ESREF '96)
N. Stojadinović
Volume 36, Number 7/8:
Special Issue on Reliability Physics of Advanced Electron Devices
R.S. Sharma, G.S. Hura
Volume 36, Number 6:
Performance Modeling and Reliability Analysis
A.H. Rawicz
Volume 35, Number 9/10:
Reliability: A Competitive Edge
N.D. Stojadinović
Volume 35, Number 3:
Reliability Physics of Advanced Electron Devices
Microelectronics Reliability
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