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Automatica

A Journal of IFAC, the International Federation of Automatic Control

Automatica
ISSN: 0005-1098
Imprint: PERGAMON
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Statistics
Impact Factor: 3.178
5-Year Impact Factor: 4.013
Issues per year: 12

Editorial Board



Editor-in-Chief

T. Basar
Coordinated Science Laboratory, University of Illinois at Urbana-Champaign, 1308 West Main Street, Champaign, IL 61801-2307, USA, Fax: +1217 244 1653, Tel: +1217 333 3607, Email: tbasar@control.csl.uiuc.edu

Editor - Systems and Control Theory:

R. Tempo
IRITI-CNR, Politecnico di Torino, corso Duca Degli Abruzzi 24, 10129 Torino, Italy, Fax: 00 39 (0)11 564 4089, Tel: 00 39 (0)11 564 7034, Fax: +39-011-564-5429563, Email: tempo@polito.it

Editor - Control and Estimation Theory:

I. Petersen
School of Electrical Engineering, Australian Defence Force Academy, University of Newcastle (New South Wales), Northcott Drive, Canberra, ACT 2600, Australia, Tel: +61 2 6268 6000, Email: irp@routh.ee.adfa.edu.au

Editor - Nonlinear Systems and Control:

A. Teel
Dept. of Electrical & Computer Engineering, University of California, Santa Barbara, CA 93106-9560, USA, Fax: +1 805 893 3262, Tel: +1 805 893 3616

Editor - Adaptive and Distributed Parameter Systems:

K. Krstic
Mech & Aerospace Engineering, University of California, San Diego (UCSD), 9500 Gilman Drive, La Jolla, CA 92093-0411, USA, Tel: (858) 822-1374, Email: mkrstic@ucsd.edu

Editor - System Parameter Estimation

T. Soderstrom
Systems & Control Group, Uppsala Universitet, Box 337, 751 05 Uppsala, Sweden, Fax: +46 18 503611, Tel: +46 18 183075, Email: torsten.soderstrom@it.uu.se

Editor - Control System Applications

D. Dochain
CESAME, Batiment Euler, Université Catholique de Louvain, avenue Georges Lemaître 4, B-1348 Louvain-la-Neuve, Belgium, Tel: 010 47 23 78, Email: denis.dochain@uclouvain.be
T. Sugie
Dept. of Systems Science, Kyoto University, 36-1 Yoshida-Honmachi, Sakyo-ku, 606-8501 Kyoto, Japan, Email: sugie@i.kyoto-u.ac.jp

Editor - Process and Computer Control

F. Allgower
Inst. für Systemtheorie Technischer Prozesse, Universität Stuttgart, Pfaffenwaldring 9, 70569 Stuttgart, Germany, Fax: +49 711 685 8058, Tel: +49 711 685 6294, Email: allgower@ist.uni-stuttgart.de

Editor - Systems Engineering, Economics and Finance:

B. Rustem
Dept. of Computing, Imperial College, 180 Queens' Gate, South Kensington Campus, London, SW7 2AZ, UK, Fax: 44715818024, Tel: 44715895111, Email: br@doc.ic.ac.uk

Editor - Survey Papers:

M. Morari
Eidgenössische Technische Hochschule Zürich (ETH), CH-8092 Zürich, Switzerland, Fax: +41 1 632 1211, Tel: +41 1 632 7626, Email: morari-Automatica@aut.ee.ethz.ch

Editor - Rapid Publications

A. Tits
Inst. Systems Research, University of Maryland, 2271 AV Williams bldg., College Park, MD 20742, USA, Email: tits-automatica@umd.edu

Editor - Book Reviews

E. Jonckheere
Dept. E.E. Systems, University of Southern California (USC), 3740 McClintock Ave., Los Angeles, CA 90089-2563, USA, Fax: 213-821-1109, Tel: 213-740-4457, Email: jonckhee@usc.edu

Founding Editor-in-Chief

G.S. Axelby

Editors-in-Chief Emeritus

H. Kwakernaak

Editorial Board:

F. Allgower
Universität Stuttgart, Stuttgart, Germany
T. Basar
University of Illinois at Urbana-Champaign, Champaign, USA
G.W. Irwin
Queen's University Belfast, Belfast, UK
S. Kahne
Embry Riddle Aeronautical University, Prescott, AZ, USA
K. Krstic
University of California, San Diego (UCSD), La Jolla, CA, USA
M. Morari
Eidgenössische Technische Hochschule Zürich (ETH), Zürich, Switzerland
I. Petersen
University of Newcastle (New South Wales), Canberra, ACT, Australia
B. Rustem
Imperial College, London, England, UK
R. Sivan
Technion - Israel Institute of Technology, Haifa, Israel
T. Soderstrom
Uppsala Universitet, Uppsala, Sweden
A. Teel
University of California, Santa Barbara, CA, USA
R. Tempo
Politecnico di Torino, Torino, Italy
A. Tits
University of Maryland, College Park, MD, USA

Associate Editors:

P. Albertos
Universidad Politécnica de Valencia, Valencia, Spain
M. Arcak
Rensselaer Polytechnic Institute, Troy, NY, USA
A. Astolfi
Imperial College, London, UK
R. Babuska
Technische Universiteit Delft, Delft, Netherlands
E.W. Bai
University of Iowa, Iowa City, IA, USA
M. Basseville
Centre National de la Recherche Scientifique (CNRS), Rennes, France
F. Blanchini
Università di Udine, Udine, Italy
K. Boel
Universiteit Gent, Gent, Belgium
R. Braatz
University of Illinois at Urbana-Champaign, Urbana, IL, USA
M. Breton
Ecole des Hautes Etudes Commerciales (HEC) Montreal, Montréal, QC, Canada
Y.Y. Cao
Indianoplis, IN, USA
C.C. Cheah
Nanyang Technological University, Singapore, Singapore
T. Chen
University of Alberta, Edmonton, AB, Canada
G. Chesi
University of Hong Kong, Hong Kong, China
A. Chiuso
Università degli Studi di Padova, Vicenza, Italy
D. Chu
National University of Singapore (NUS), Singapore, Singapore
F. Dabbene
Politecnico di Torino, Torino, Italy
G. De Nicolao
Pavio, Italy
B. De Schutter
Technische Universiteit Delft, Delft, Netherlands
W. Dixon
University of Florida, Gainesville, FL, USA
M. Enqvist
Linköping University, Linköping, Sweden
E. Fridman
Tel Aviv University, Tel Aviv, Israel
Y. Fujisaki
Kobe University, KOBE, Japan
F. Fujita
Tokyo Institute of Technology, Meguro-ku, Tokyo, Japan
E.P. Gatzke
University of South Carolina, Columbia, SC, USA
S.S. Ge
National University of Singapore (NUS), Singapore, Singapore
G. Gu
Louisiana State University, Baton Rouge, LA, USA
K. Gu
Southern Illinois University at Carbondale, Edwardsville, IL, USA
X. Guan
Xi'an Jiaotong University, Xi"an, China
M. Guay
Queen's University, Kingston, ON, Canada
V. Havlena
Prague 4, Czech Republic
Y. Hayakawa
Nagoya University, Nagoya, Japan
M. Heemels
Technische Universiteit Eindhoven, Eindhoven, Netherlands
D. Henrion
Centre National de la Recherche Scientifique (CNRS), Toulouse, France
M.A. Henson
University of Massachusetts at Amherst, Amherst, MA, USA
J. Hu
Fudan University, Shanghai, China
H.J.C. Huijberts
Queen Mary, University of London, London, England, UK
J.I. Imura
Tokyo Institute of Technology, Tokyo, Japan
H. Ishii
Tokyo Institute of Technology, Yokohama, Japan
F. Jabbari
University of California at Irvine, Irvine, CA, USA
M. Johansson
Royal Institute of Technology (KTH), Stockholm, Sweden
R. Katebi
University of Strathclyde, Glasgow, UK
I. Kolmanovsky
Ford Motor Company, Dearborn, MI, USA
M. Kothare
Lehigh University, Bethlehem, PA, USA
J. Lam
University of Hong Kong, Hong Kong, China
Z. Lin
University of Virginia, Charlottesville, VA, USA
D. Liu
University of Illinois at Chicago (UIC), Chicago, USA
A. Loria
Centre National de la Recherche Scientifique (CNRS), Gif sur Yvette, France
L. Magni
Università degli Studi di Pavia, Pavia, Italy
M. Malisoff
Louisiana State University, Baton Rouge, LA, USA
D. Nesic
University of Melbourne, Melbourne, VIC, Australia
H. Nijmeijer
Technische Universiteit Eindhoven, Eindhoven, Netherlands
B. Ninness
University of Newcastle (New South Wales), Callaghan, NSW, Australia
Y. Ohta
Kyoto University, Kyoto, Japan
R. Ordonez
University of Dayton, Dayton, OH, USA
N. Petit
MINES ParisTech, Paris Cedex 06, France
Z. Qu
University of Central Florida, Orlando, USA
A.V. Savkin
University of New South Wales, Sydney, Australia
W. Scherrer
Universität Wien, Wien, Austria
J. Schoukens
Vrije Universiteit Brussel (VUB), Bruxelles, Belgium
A. Serrani
The Ohio State University, Columbus, OH, USA
S.P. Sethi
University of Texas at Dallas, Richardson, TX, USA
M. Sezer
Bilkent University, Bilkent, Ankara, Turkey
M. Sznaier
Pennsylvania State University, University Park, PA, USA
X. Tan
Michigan State University (MSU), East Lansing, MI, USA
K. Tanaka
University of Electro-Communications, Tokyo, Japan
G. Tao
University of Virginia, Charlottesville, VA, USA
K. Teo
Curtin University of Technology, Perth, WA, Australia
M.E. Valcher
Università degli Studi di Padova, Padova, Italy
A. Vicino
Università degli Studi di Siena, Siena, Italy
G. Weiss
Tel Aviv University, Tel Aviv, Israel
C. Wen
Nanyang Technological University, Singapore, Singapore
F. Wu
North Carolina State University, Raleigh, NC, USA
X. Xia
University of Pretoria, Pretoria, South Africa
M. Xiao
Southern Illinois University at Carbondale, Carbondale, IL, USA
L. Xie
Nanyang Technological University, Singapore, Singapore
M. Yamakita
Tokyo Institute of Technology, Tokyo, Japan
G. Yin
Wayne State University (WSU), Detroit, MI, USA
H. Zhang
Northeastern University, Shenyang City, China
T. Zhou
Tsinghua University, Beijing, China
U.R. Zimmer
Australian National University (ANU), Canberra, ACT, Australia
 
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