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Image and Vision Computing

Image and Vision Computing
ISSN: 0262-8856
Imprint: ELSEVIER
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Statistics
Impact Factor: 1.496
5-Year Impact Factor: 2.489
Issues per year: 12

Editorial Board



Editors in Chief

K.D. Baker
Dept. of Computer Science, University of Reading, Whiteknights, Reading, Berkshire, RG6 6AY, UK, Fax: +44 118 975 1994, Tel: +44 118 931 8602
M. Pantic
Dept. of Computing, Imperial College, 180 Queens' Gate, South Kensington Campus, London, SW7 2AZ, UK, Fax: +44 207 581 8024, Tel: +44 207 594 8195

Editor for North America


Editor for Asia

L. Quan
Hong Kong University of Science & Technology, Clear Water Bay, Kowloon, Hong Kong, Email: quan@cs.ust.hk

Advisory Editors

J.K. Aggarwal
University of Texas at Austin, Austin, USA
A. Blake
Microsoft Research Ltd, Redmond, WA, USA
K.W. Bowyer
University of Notre Dame, Notre Dame, IN, USA
M. Jenkin
York University (Toronto), Toronto, ON, Canada
G. Medioni
University of Southern California (USC), Los Angeles, CA, USA
A.P. Pentland
Massachusetts Institute of Technology, Cambridge, MA, USA
J.K. Tsotsos
York University (Toronto), Toronto, ON, Canada

Editorial Board

R. Abugharbieh
University of British Columbia at Vancouver, Vancouver, BC, Canada
Y. Aloimonos
University of Maryland, College Park, MD, USA
Y. Andreopoulos
University College London, London, England, UK
J. Barron
University of Western Ontario, London, ON, Canada
C. Bauckhage
Deutsche Telekom AG, Berlin, Germany
R. Beveridge
Colorado State University, Fort Collins, CO, USA
V. Blanz
Universität Siegen, Siegen, Germany
R. Bowden
University of Surrey, Guildford, Surrey, England, UK
E. Boyer
INRIA Rhone-Alpes, Saint Ismier, France
R.M. Cesar-Jr.
Universidade de Sao Paulo, SAO PAULO, Brazil
R. Chellappa
University of Maryland, College Park, MD, USA
H.I. Christensen
Georgia Institute of Technology, Atlanta, GA, USA
T.F. Cootes
University of Manchester, Manchester, England, UK
S. Dickinson
University of Toronto, Toronto, Canada
J.O. Eklundh
Royal Institute of Technology (KTH), Stockholm, Sweden
A. Elgammel
Rutgers University, Piscataway, NJ, USA
J.-M. Frahm
University of North Carolina at Greensboro, Greensboro, NC, USA
D. Gatica-Perez
IDIAP Research Institute, Martigny, Switzerland
E. Hancock
University of York, Heslington, York, UK
A. Hanjalic
Technische Universiteit Delft, Delft, Netherlands
Q. Ji
Rensselaer Polytechnic Institute, New York, NY, USA
J. Jiang
University of Bradford, Bradford, UK
G. Jones
University of South Australia, Kingston upon Thames, Surrey, England, UK
J.J. Koenderink
Universiteit Utrecht, Utrecht, Netherlands
I. Laptev
INRIA, Rennes Cedex, France
E.G. Learned-Miller
University of Massachusetts at Amherst, Amherst, MA, USA
S.-W. Lee
Korea University, Seoul, South Korea
S.Z. Li
Chinese Academy of Sciences (CAS), Beijing, China
C. Liu
National Laboratory of Pattern Recognition, Beijing, China
A.M. Martinez
The Ohio State University, Columbus, OH, USA
E. Memin
INRIA, Rennes Cedex, France
P. Milanfar
University of California at Santa Cruz, Santa Cruz, CA, USA
M.S. Nixon
University of Southampton, Southampton, England, UK
I. Patras
Queen Mary, University of London, London, England, UK
V. Pavlovic
Rutgers University, Piscataway, NJ, USA
I. Reid
University of Oxford, Oxford, UK
P. Remagnino
Kingston University London, Surrey, Kingston-upon-Thames, England, UK
S. Sarkar
University of South Florida, Tampa, FL, USA
B. Schiele
Technische Universität Darmstadt, Darmstadt, Germany
N. Sebe
Universiteit van Amsterdam (UVA), Amsterdam, Netherlands
S.K. Shah
University of Houston, Houston, TX, USA
M. Smith
University of the West of England, Bristol, England, UK
P. Sturm
INRIA, St Ismier, France
T. Tan
Curtin University of Technology, Perth, WA, Australia
S. Todorovic
Oregon State University, Corvallis, OR, USA
M. Turk
University of California, Santa Barbara CA, USA
D. Vernon
Khalifa University, Sharjah, United Arab Emirates
H. Wei
University of Reading, Reading, England, UK
M.-H. Yang
University of California at Merced, Merced, CA, USA
L. Yin
State University of New York (SUNY) at Binghamton, Binghamton, NY, USA
 
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