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Ultramicroscopy

An international journal affiliated with MSA, ISEM, SCANDEM, NVEM, SGOEM, SIME-SM, DGE, MSC, ASEM and MSSA, committed to the advancement of new methods, tools and theories in microscopy

Ultramicroscopy
ISSN: 0304-3991
Imprint: ELSEVIER
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Statistics
Impact Factor: 2.629
5-Year Impact Factor: 2.629
Issues per year: 12

Editorial Board



Editor:

P.A. Midgley
Dept. of Materials Science and Metallurgy, University of Cambridge, New Museum Site Pembroke Street, Cambridge, CB2 3QZ, UK

Associate Editor (for scanning probe microscopy):

S.M. Lindsay
Arizona State University, Tempe AZ, USA, Email: stuart.lindsay@asu.edu

Editorial Board:

W. Baumeister
Martinsried, Germany
A. Cerezo
Oxford, UK
J-P. Chevalier
Vitry sur Seine, France
D.J.H. Cockayne
Oxford, UK
A.G. Cullis
Sheffield, UK
U. Dahmen
Berkeley, CA, USA
K.H. Downing
Berkeley, CA, USA
C. Durkan
Cambridge, UK
R.F. Egerton
Edmonton, AB, Canada
A. Engel
Basel, Switzerland
J. Frank
New York, NY, USA
H.-J. Güntherodt
Basel, Switzerland
P.W. Hawkes
Toulouse cedex 4, France
S. Iijima
Tsukuba, Ibaraki, Japan
C. Jacobsen
Stony Brook, NY, USA
H. Kohl
Münster, Germany
R. Leapman
Bethesda, USA
D.A. Muller
Ithaca, NY, USA
L.-M. Peng
Beijing, China
G. Pozzi
Bologna, Italy
M. Radmacher
Bremen, Germany
M. Rühle
Stuttgart, Germany
D.J. Smith
Tempe, USA
J.C.H. Spence
Tempe AZ, USA
R. Sperling
Jerusalem, Israel
K. Takayanagi
Yokohama, Japan
A. Tonomura
Saitama, Japan
D. Van Dyck
Antwerpen, Belgium
R. Vincent
Bristol, England, UK
M.J. Witcomb
Wits, South Africa
H.W. Zandbergen
Delft, Netherlands
 
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