Inst. of Computing and Information Sciences, Radboud Universiteit Nijmegen, Toernooiveld 1, 6500 NL Nijmegen, Netherlands, Fax: +31 24 3554074, Tel: +31 24 3652696, Fax: +31-(0)24-3652728, Email: neucom-eo@elsevier.com
Associate Editor:
N. Ozcan
Department of Electrical-Electronics Engineering, Faculty of Engineering, Istanbul University, Avcilar, 34320 Istanbul, Turkey, Email: neyir@istanbul.edu.tr
Current Events Editor:
G. Thimm
School of MPE, Nanyang Technological University, Nanyang Technological University 50 Nanyang Avenue, 639798 Singapore, Singapore, Tel: +65 790 5010, Email: mgeorg@ntu.edu.sg
Editors for Brief Papers and Short Communications:
L.C. Jain
School of Electronic and Information Engineering, University of South Australia, The Levels, Adelaide, SA 5095, Australia, Fax: +61 8 830 23384, Tel: +61 8 830 23315, Email: lakhmi.jain@unisa.edu.au
Editorial Board:
A. Abraham
Chung-Ang University, Seoul, South Korea
H. Adeli
The Ohio State University, Columbus, OH, USA
A.M. Alimi
University of Sfax, Nat. School of Engineering, Sfax, Tunisia
S. Amari
University of Tokyo, Bunkyo-Ku, Japan
B. Apolloni
Università degli Studi di Milano, Milano, Italy
S. Arik
Istanbul University, Istanbul, Turkey
D. Barber
IDIAP Research Institute, Martigny, Switzerland
M. Bianchini
Università degli Studi di Siena, Siena, Italy
I. Bojak
Universitair Medisch Centrum Nijmegen St Radboud, Nijmegen, Netherlands
J. Cao
Southeast University, Nanjing, China
R. Capobianco Guido
D.P. Casasent
Carnegie Mellon University, Pittsburgh, PA, USA
M. Chetty
Monash University, Churchill, VIC, Australia
S. Choi
Pohang University of Science and Technology, Nam-Gu, Pohang-si, South Korea
K.J. Cios
University of Colorado at Denver, Denver, CO, USA
W.L. Dunin-Barkowski
Russian Academy of Sciences, Moscow, Russian Federation