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PATTERN RECOGNITION LETTERS
An official publication of the International Association for Pattern Recognition

ISSN: 0167-8655


Editorial Board


Editors-in-Chief:

T.K. Ho
Bell Laboratories, Lucent Technologies, 700 Mountain Avenue, Murray Hill, NJ 07974-0636, USA, Tel: +1 908 582 5989, Fax: +1 908 582 5857, Email: tkh@research.bell-labs.com
G. Sanniti di Baja
Istituto di Cibernetica CNR, Via Campi Flegrei 34, 80078 Pozzuoli, Napoli, Italy, Tel: +39 081 86 75163, Email: gsdb@cib.na.cnr.it


Area Editors:

G. Borgefors
Swedish University of Agricultural Sciences, Uppsala, Sweden
H. Ip
City University of Hong Kong, Kowloon, Hong Kong
T. Tan
Chinese Academy of Sciences, Beijing, China


Associate Editors:

S. Ablameyko
Belarussian Academy of Sciences, Minsk, Belarus
A.M. Alimi
University of Sfax, Tunisia
T. Bengtsson
Bell Laboratories, Murray Hill, NJ, USA
P. Bhattacharya
Panasonic Information & Networking, Princeton, NJ, USA
T. Breuel
DFKI and Technical University Kaiserslautern, Kaiserslautern, Germany
R. Capobianco Guido
Institute of Physics at Sao Carlos, University of Sao Paulo, Sao Carlos, Brazil
M. Couprie
Laboratory ESIEE 2, Noisy-Le-Grand, France
R. Cucchiara
Universita degli Studi di Modena e Reggio Emilia, Modena, Italia
E.R. Davies
University of London, Egham, Surrey, UK
S. Dickinson
University of Toronto, Ontario, Canada
A. Fred
Instituto Superior Tecnico - IST, Lisbon, Portugal
M.A. Girolami
University of Glasgow, Scotland, UK
L. Heutte
Université de Rouen, France
T. Hofmann
Technical University of Darmstadt, Darmstadt, Germany
F. Hsu
Fordham University, Bronx, NY, USA
Qiang Ji
Rensselaer Polytechnic University, Troy, NY, USA
M. Kamel
University of Waterloo, Ont, Canada
B. Kamgar-Parsi
Naval Research Laboratory, Washington, DC, USA
H. Kim
INHA University, Incheon, Korea
M.J. Li
Microsoft Research Asia, Beijing, China
M. Lindenbaum
Technion, Haifa, Israel
B.C. Lovell
The University of Queensland, Brisbane, Australia
Y. Ma
Honeywell Laboratories, Minnesota, USA
R. Manmatha
University of Massachusetts, Amherst, USA
S.K. Pal
Indian Statistical Institute, Calcutta, India
N. Pears
University of York, York, UK
W. Pedrycz
University of Alberta, Edmonton, Alberta, Canada
N.S.V. Rao
Center for Engineering Science Advanced Research, Oak Ridge, USA
J. Robinson
University of York, UK
F. Roli
University of Cagliari,Cagliari, Italy
H. Sako
Hitachi Central Research Laboratory, Tokyo, Japan
P. Sarkar
Palo Alto Research Center, Palo Alto, CA, USA
F. Shih
New Jersey Institute of Technology, Newark, NJ, USA
M. Singh
Princeton University, NJ, USA
O. Siohan
IBM T.J. Watson Research Center, Yorktown Heights, NY, USA
C.L. Tan
National University of Singapore, Singapore
K. Tumer
NASA Ames Research Center, Moffett Field, CA, USA
A.V. Vasilakos
University of Western Macedonia, Kozani, Greece
H. Wechsler
George Mason University, Fairfax, VA, USA
L. Younes
The John Hopkins University, Baltimore, MD, USA
Y.J. Zhang
Tsinghua University, Beijing, People's Republic of China
W. Zhao
Intuitive Surgical, Sunnyvale, CA, USA


Advisory Editors:

R.P.W. Duin
Delft University of Technology, Faculty of Applied Physics, Delft, The Netherlands
A.K. Jain
Michigan State University, East Landsing, MI, USA
J. Kittler
University of Surrey, Guildford, UK
W.G. Kropatsch
Vienna University of Technology, Wien, Austria
C.Y. Suen
Concordia University, Montréal, Quebec, Canada


Founding Editors:

E. Backer

E.S. Gelsema†

Pattern Recognition Letters
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