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Pattern Recognition Letters

An official publication of the International Association for Pattern Recognition

Pattern Recognition Letters
ISSN: 0167-8655
Imprint: NORTH-HOLLAND
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Impact Factor: 1.559
Issues per year: 16

Editorial Board



Editors-in-Chief:

T.K. Ho
Bell Laboratories, Alcatel-Lucent, 700 Mountain Avenue, Murray Hill, NJ 07974-0636, USA, Tel: +1 908 582 5989, Fax: +1 908 582 5857, Email: tkh@research.bell-labs.com
G. Sanniti di Baja
Istituto di Cibernetica CNR, Via Campi Flegrei 34, 80078 Pozzuoli, Napoli, Italy, Tel: +39 081 86 75163, Email: gsdb@cib.na.cnr.it

Area Editors:

G. Borgefors
Swedish University of Agricultural Sciences, Uppsala, Sweden
H. Ip
City University of Hong Kong, Kowloon, Hong Kong, China
T. Tan
Chinese Academy of Sciences, Beijing, China

Associate Editors:

S. Ablameyko
Belarussian Academy of Sciences, Minsk, Belarus
S. Aksoy
Bilkent University, Bilkent, Ankara, Turkey
A.M. Alimi
University of Sfax, Tunisia
T. Bengtsson
Bell Laboratories, Murray Hill, NJ, USA
E. Bernadó-Mansilla
Universitat Ramon Llull, Barcelona, Spain
P. Bhattacharya
Concordia University, Montreal, Canada
T. Breuel
DFKI and Technical University Kaiserslautern, Kaiserslautern, Germany
R. Capobianco Guido
Institute of Physics at Sao Carlos, University of Sao Paulo, Sao Carlos, Brazil
M. Couprie
Laboratory ESIEE 2, Noisy-Le-Grand, France
R. Cucchiara
Universita degli Studi di Modena e Reggio Emilia, Modena, Italia
E.R. Davies
University of London, Egham, Surrey, UK
S. Dickinson
University of Toronto, Ontario, Canada
A. Fernández-Caballero
Universidad de Castilla La Mancha, Albacete, Spain
M. Ferretti
Universita Degli Studi di Pavia, Pavia, Italy
A. Fred
Instituto Superior Tecnico - IST, Lisbon, Portugal
P. Fränti
University of Joensuu, Joensuu, Finland
M.A. Girolami
University of Glasgow, Scotland, UK
R.C. Guido
Universidade de São Paulo, São Carlos, São Paulo, Brazil
L. Heutte
Université de Rouen, France
F. Hsu
Fordham University, Bronx, NY, USA
Qiang Ji
Rensselaer Polytechnic University, Troy, NY, USA
M. Kamel
University of Waterloo, Ont, Canada
B. Kamgar-Parsi
Naval Research Laboratory, Washington, DC, USA
M.J. Li
Microsoft Research Asia, Beijing, China
M. Lindenbaum
Technion, Haifa, Israel
Y. Liu
Aberystwyth University, Aberystwyth, Wales, United Kingdom
B.C. Lovell
The University of Queensland, Brisbane, Australia
Y. Ma
Honeywell Laboratories, Minnesota, USA
R. Manmatha
University of Massachusetts, Amherst, USA
S.K. Pal
Indian Statistical Institute, Calcutta, India
N. Pears
University of York, York, UK
W. Pedrycz
University of Alberta, Edmonton, Alberta, Canada
N.S.V. Rao
Center for Engineering Science Advanced Research, Oak Ridge National Laboratory, TN, USA
J. Robinson
University of York, UK
F. Roli
University of Cagliari,Cagliari, Italy
H. Sako
Hitachi Central Research Laboratory, Tokyo, Japan
P. Sarkar
Palo Alto Research Center, Palo Alto, CA, USA
F.Y.C. Shih
New Jersey Institute of Technology, Newark, NJ, USA
A. Shokoufandeh
Drexel University, Philadelphia, Pennsylvania, USA
M. Singh
Princeton University, NJ, USA
O. Siohan
Google
C.L. Tan
National University of Singapore, Singapore
A. Vasilakos
University of Western Macedonia, Kozani, Greece
H. Wechsler
George Mason University, Fairfax, VA, USA
J. Yang
Nanjing University of Science and Technology, Nanjing, China
Y.J. Zhang
Tsinghua University, Beijing, China
W. Zhao
Intuitive Surgical, Sunnyvale, CA, USA

Advisory Editors:

R.P.W. Duin
Delft University of Technology, Faculty of Applied Physics, Delft, The Netherlands
A.K. Jain
Michigan State University, East Landsing, MI, USA
J. Kittler
University of Surrey, Guildford, UK
W.G. Kropatsch
Vienna University of Technology, Wien, Austria
C.Y. Suen
Concordia University, Montréal, Quebec, Canada

Founding Editors:

E. Backer
E.S. Gelsema†
 
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