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Micron

The International Research and Review Journal for Microscopy

Micron
ISSN: 0968-4328
Imprint: ELSEVIER
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Statistics
Impact Factor: 1.839
5-Year Impact Factor: 1.870
Issues per year: 8

Editorial Board



Editors:

D.J.H. Cockayne
Dept. of Materials, University of Oxford, 16 Parks Road, Oxford, OX1 3PH, UK
R.F. Egerton
Dept. of Physics, University of Alberta, 11322 - 89 Avenue, Edmonton, T6G 2J1, Canada
J.R. Harris
Inst. of Zoology, Johannes-Gutenberg-Universität Mainz, Müller Weg 6, D-55099 Mainz, Germany

Editorial Board:

U. Aebi
Basel, Switzerland
D. Bhella
Glasgow, UK
E.J. Boekema
Groningen, Netherlands
G. Botton
Hamilton, ON, Canada
N.D. Browning
Davis, CA, USA
J.L. Carrascosa
Madrid, Spain
G. Cox
Sydney, NSW, Australia
K.K. Fung
Hong Kong, China
P. Gualtieri
Pisa, Italy
M.A. Hayat
Union NJ, USA
Sir P. Hirsch, FRS
Oxford, UK
F. Hofer
Graz, Austria
A. Holzenburg
College Station, TX, USA
J.L. Hutchison
Oxford, UK
H. Luensdorf
Braunschweig, Germany
D.A. Muller
Ithaca, NY, USA
L.-M. Peng
Beijing, China
M. Sarikaya
Seattle, WA, USA
M. Tzaphlidou
Ioannina, Greece
Z.L. Wang
Atlanta, GA, USA
Y. Zhu
Upton, NY, USA
 
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