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MICROELECTRONICS JOURNAL

ISSN: 0026-2692


Editorial Board


Editors-in-Chief:

B. Courtois (Editor Circuits and Systems)
TIMA/CMP, 46 Avenue Felix Viallet, 38031 Grenoble Cedex, France, Tel: +33 476 574 615, Fax: +33 476 473 814, Email: Bernard.Courtois@imag.fr
M. Henini (Editor Physics and Devices)
School of Physics and Astronomy, University of Nottingham, NG7 2RD, UK, Tel: +44 115 951 5195, Fax: +44 115 951 5180, Email: mohamed.henini@nottingham.ac.uk


Book Reviews:

M. Henini
School of Physics and Astronomy, University of Nottingham, NG7 2RD, UK, Email: mohamed.henini@nottingham.ac.uk


Editorial Board:

Ah Ong (Andrew) Tay
Department of Mechanical & Prodcution Engineering, National University of Singapore, Singapore 119260, Singapore, Tel: +65 874 2207, Fax: +65 779 1459, Email: mpetayao@nus.edu.sg
H. Akinaga
Nanotechnology Research Institute (AIST), Tsukuba, Ibaraki 305-8562, Japan, Email: akinaga.hiro@aist.go.jp
Prof. A. Amara
ISEP, Laboratoire de Microélectronique, 21 rue d'Assas, 75270 Paris cedex 6, France, Tel: +33 14954 5273, Fax: +33 14954 5251, Email: amara.amara@isep.fr
Prof. K. Chakrabarty
Duke University, Durham, NC 27708, Tel: (9) 684-8111, Email: krish@ee.duke.edu
Prof. J. Deen
McMaster University, Dept. Electrical and Computer Engineering, 226 Communications Research Laboratory, 1280 Main Street W, Hamilton, Ontario, L8S 4K1, Fax: 905-523-4407, Email: jamal@mcmaster.ca
Prof. D. De Venuto
Politecnico di Bari, Dipartimento di Elettrotecnica ed Elettronica, Via orabona 4, 70125 Bari, Italy, Tel: +39 080 5963 313, Fax: +39 080 5963 410, Email: d.devenuto@poliba.it
Prof. L. Diaz-Olavarrieta
Universidad de las Americas Puebla, Sta, Catarina Martir, Cholula, Puebla, C.P, 72820, Mexico, Email: liliana.diaz@udlap.mx
Prof. E.G. Friedman
University of Rochester, Department of Electrical and Computer Engineerin, Computer Studies Building 420, P.O. Box 270231, Rochester, NY 14627, USA, Tel: +1 585 275 1022, Fax: +1 585 506 0074, Email: friedman@ece.rochester.edu
H. Hasegawa
Research Centre for Interface Quantum Electronics, Graduate School of Electronics and Information Technology, Hokkaido University, Sapporo, Japan, Fax: + 81 117571165, Email: hasegawa@ryouko.rciqe.hokudai.ac.jp
I. Hernandez-Calderon
Centro de Investigacion Y de Estudios Avanzados, Mexico, Fax: +52 57477096, Email: ihernand@fis.cinvestav.mx
S. Ejaz Huq
Central Microstructure Facility, Rutherford Appleton Laboratory, Didcot, UK, Fax: +44 (0)1235 445706, Email: huq@vi.rl.ac.uk
E. Kapon
Laboratoire de Physique des Nanostructures (LPN), Swiss Federal Institute of Technology (EPFL), 1015 Lausanne, Switzerland, Tel: +41 21 693 3388, Fax: +41 21 693 4525, Email: eli.kapon@epfl.ch
N.N. Ledentsov
Physics of Semiconductor Heterostructures Laboratory, Ioffe Physico-Technical Institute, 26 Politehnicheskaya str., St Petersburg 194021, Russia, Email: leden@beam.ioffe.rssi.ru
Prof. P. Marwedel
Universität Dortmund, Informatik XII (CS&E), E21 44221 Dortmund, Germany, Tel: +49 231 755 6111, Fax: +49 231 755 6116, Email: peter.marwedel@udo.edu
Prof. T.F. Melham
Oxford University, Computing Laboratory, Wolfson Building, Parks Road, Oxford OX1 3QD, UK, Tel: +44 1865 273824, Fax: +44 1865 273839, Email: tom.melham@comlab.ox.ac.uk
Prof. C. Metra
University of Bologna, DEIS, 40136 Bologna, Italy, Tel: +39 51 6443015, Fax: +39 51 6443073, Email: cmetra@deis.unibo.it
R. Noetzel
Eindhoven University of Technolgy, COBRA Inter-University Research Institute, P.O. Box 513, 5600 MB Eindhoven, The Netherlands, Tel: +31 40 247 2047, Fax: +31 40 246 1339, Email: r.noetzel@tue.nl
P. Panayotatos
Department of Electrical and Computer Engineering, Rutgers University, PO Box 909, Piscataway, NJ 08855-0909, USA, Tel: +1 732 445 3382, Fax: +1 732 445 3382, Email: panayot@ece.rutgers.edu
F. Peeters
University of Antwerp, Antwerpen, Belgium, Tel: +32-(0)3-265.36.64, Fax: +32-(0)3-265.35.42, Email: francois.peeters@ua.ac.be
Dr. C. Piguet
CSEM, Integrated Circuits & Systems, CH-2007 Neuchatel, Switzerland, Email: christian.piquet@csem.ch
M. Razeghi
Electrical and Computer Engineering, Materials and Life Sciences Building, 2225 North Campus Drive 4051, Evanston, IL 60208, USA, Tel: +1 847 491 7251, Fax: +1 847 467 1817, Email: razeghi@ece.nwu.edu
Prof. M. Rencz
Budapest University of Technology and Economics, H-1521 Budapest, Hungary, Tel: +36 1 463 2727, Fax: +36 1 463 2973, Email: rencz@eet.bme.hu
Prof. A. Rubio
UPC Barcelona, 08034 Barcelona, Spain, Email: rubio@eel.upc.es
H. Sitter
Johannes Kepler Universität, Institut fü Halbleiter und Festkörperphysik, Altenbergerstrasse 96, A-4040 Linz, Austria, Tel: +43 732 2468 9623, Fax: +43 732 2468 9696, Email: helmut.sitter@jk.uni-linz.ac.at
M.A. Stroscio
University of Illinois at Chicago, Illinois, 60607 USA, Email: stroscio@tigger.cc.uic.edu
R. Tsu
Electrical and Computer Engineering, Cameron Applied Research, Room 204, The University of North Carolina at Charlotte, 9201 University City Blvd., Charlotte, NC 28223-0001, USA, Tel: +1 704 687 2803, Email: tsu@uncc.edu
S.F. Yoon
School of Electrical & Electronic Engineering, Microelectronics Centre, Block S1, Nanyang Technological University, Nanyang Avenue, Singapore 639798, Fax: +65 791 2687, Email: esfyoon@ntu.edu.sg
Microelectronics Journal
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