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Pattern Recognition

The Journal of the Pattern Recognition Society

Pattern Recognition
ISSN: 0031-3203
Imprint: PERGAMON
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Statistics
Impact Factor: 3.279
5-Year Impact Factor: 3.725
Issues per year: 12

Editorial Board



Editor-in-Chief:

Ching Y. Suen
C/o CENPARMI, Concordia University, 1515 Ste-Catherine West, Montreal, Canada, Tel: +1 514 848 2424, Fax: +1 514 848 2830, Email: parmidir@cenparmi.concordia.ca

Founding Editor:

Robert S. Ledley
Maryland, USA

Advisory Editors:

H. Bunke
University of Bern, Switzerland
R. Chin
Hong Kong University of Science & Technology, Hong Kong
L. Shapiro
University of Washington, WA, USA

Editorial Board:

M. Ahmadi
Canada
M. Basu
USA
B. Bhanu
USA
P. Bhattacharya
Canada
H. Bischof
Austria
R. Bolle
USA
D. Bouchaffra
USA
C.H. Chen
USA
H-D Cheng
USA
M. Cheriet
Canada
A. Dhawan
USA
Z. Duric
USA
M.R. El-Sakka
Canada
T. Eltoft
Norway
B. Gunsel
Turkey
A. Guzman-Arenas
Mexico
E. Hancock
UK
L. Heutte
France
J. Illingworth
UK
A. Imiya
Japan
X. Jiang
Germany
J-M. Jolion
France
M. Kamel
Canada
A. Krzyzak
Canada
L. Lam
Canada
L.J. Latecki
USA
S-W. Lee
Korea
A. Leonardis
Slovena
Xuelong Li
UK
J. Luo
USA
B. Mehtre
India
R. Melter
USA
V. Murino
Italy
H. Nishida
Japan
M. Pelillo
Italy
T. Pham
Australia
S. Sarkar
USA
R. Schettini
Italy
A. Senior
USA
D. Shen
USA
F. Shih
USA
P. Suganthan
Singapore
R. Veltkamp
The Netherlands
N. Vincent
France
H. Yang
Canada
D-Y. Yeung
Hong Kong
P. Yuen
Hong Kong
C. Zhang
China
 
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