 | | | | |  | | MICROELECTRONICS RELIABILITY | | | | | | | Former title: Microelectronics and Reliability
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Editorial Board | |
Joint Editors-in-Chief | | | N.D. Stojadnovic | Department of Microelectronics, Faculty of Electronic Engineering, University of Nis, Aleksandra Medvedeva 14, 18000 Nis, Serbia, Tel: 381 18 529 326, Fax: 381 18 588 399, Email: nstojadinovic@elfak.ni.ac.yu
| | | M.G. Pecht | CALCE Electronic Products and Systems Center, University of Maryland, College Park, MD 20742, USA, Fax: +1 301 314 9269, Email: pecht@eng.umd.edu
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Associate Editors: | | | G. Ghibaudo | Directeur de Recherche au CNRS, IMEP, ENSERG, BP 257, 38016 Grenoble, France, Tel: 00 33 476 85 60 58, Fax: 00 33 476 85 60 70, Email: ghibaudo@enserg.fr
| | | Y.S. Lai | Advanced Semiconductor Engineering, Inc., Nantze, Kaohsiung, Taiwan, Tel: 886 7 361 7131 ext. 15285, Email: Yishao_Lai@aseglobal.com
| | | J.H. Stathis | IBM Research, Yorktown Heights, NY 10598, USA, Tel: +1 914 945 2559, Fax: +1 914 945 2141, Email: stathis@us.ibm.com
| | | Hei Wong | Department of Electronic Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Kowloon, Hong Kong, Fax: +852 2788 7791, Email: eehwong@cityu.edu.hk
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Founding Editor: | | | G.W.A. Dummer | Malvern, UK
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Editorial Advisory Board: | | | M. Amagai | Texas Instruments Japan, Oita, Japan
| | | E. Atanassova | Bulgarian Academy of Sciences, Sofia, Bulgaria
| | | Y.C. Chan | City University of Hong Kong, Hong Kong
| | | C.Y. Chang | National Chiao Tung University, Hsinchu, Taiwan, ROC
| | | P. Chaparala | National Semiconductor Corp., 2900 Semiconductor, Santa Clara, CA, USA
| | | D. Das | CALCE Electronic Products and System Center, College Park, MD, USA
| | | G. De Mey | University of Ghent, Belgium
| | | S. Dimitrijev | Griffith University, Nathan, Brisbane, Australia
| | | A. Dziedzic | Wroclaw University of Technology, Wroclaw, Poland
| | | F. Fantini | University of Modena, Modena, Italy
| | | D.M. Fleetwood | Vanderbilt University, Nashville, TN, USA
| | | D. Flores | Centro Nacional de Microelectronica, Bellaterra, Barcelona, Spain
| | | M. Fukuda | NTT Optoelectronics Laboratories, Kanagawa, Japan
| | | R. Ghaffarian | California Institute of Technology, Pasadena, CA, USA
| | | G. Groeseneken | IMEC, Leuven, Belgium
| | | H. Iwai | Tokyo Institute of Technology, Japan
| | | K.N. Kim | Samsung, Yongin City, South Korea
| | | N. Labat | Universite Bordeaux 1, Talence, Cedex, France
| | | C.J.M. Lasance | Philips Centre for Manufacturing Technology, Eindhoven, The Netherlands
| | | J.J. Liou | University of Central Florida, Orlando, FL, USA.
| | | R. Menozzi | Universita' di Parma, Parma, Italy
| | | E. Miranda | Universidad de Buenos Aires, Buenos Aires, Argentina
| | | H.S. Momose | Advanced CMOS Technology Department, TOSHIBA Corporation, 8, Shin-Sugita-cho, Isogo-ku, Yokohama 235-8522, Japan
| | | A.J. Mouthaan | University of Twente, Enschede, The Netherlands
| | | A. Nathan | University of Waterloo, Ontario, Canada
| | | A. Ortiz-Conde | Universidad Simon Bolivar, Caracas, Venezuela
| | | P. Perdu | DCT/AQ/LE, Toulouse, Cedex, France
| | | V.S. Pershenkov | Moscow Engineering Physics Institute, Moscow, Russia
| | | M.K. Radhakrishnan | Reliability Consultant, Singapore
| | | W. Stadler | Infineon Technologies, Munich, Germany
| | | V. Szekely | Technical University of Budapest, Hungary
| | | R. Vollertsen | Infineon Technologies AG, Muenchen, Germany
| | | S. Yoshitomi | Toshiba Corporation, Kawasaki, Japan.
| | | G.Q.K. Zhang | Strategy/Philips Semiconductors, Eindhoven, The Netherlands
| | | M. Zwolinski | University of Southampton, Southampton, UK
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